2017
DOI: 10.1109/tcsi.2017.2705116
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A 32 kb 0.35–1.2 V, 50 MHz–2.5 GHz Bit-Interleaved SRAM With 8 T SRAM Cell and Data Dependent Write Assist in 28-nm UTBB-FDSOI CMOS

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Cited by 15 publications
(4 citation statements)
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“…This is in addition to the read and hold stability of memory cells, both enhanced by the appropriate cell design. By including assist circuits in the memory design, the write-ability of the device may be improved [9,[11][12][13][14][15][16][17][18][19][20][21][22][23]. The main intention of designing the proposed assist circuit is to improve the write performance.…”
Section: Introductionmentioning
confidence: 99%
“…This is in addition to the read and hold stability of memory cells, both enhanced by the appropriate cell design. By including assist circuits in the memory design, the write-ability of the device may be improved [9,[11][12][13][14][15][16][17][18][19][20][21][22][23]. The main intention of designing the proposed assist circuit is to improve the write performance.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, SRAMs operating in the near-or sub-threshold have significantly degraded Ion-to-Ioff ratios and exponentially increased variations, which deteriorates various SRAM design parameters. Many design techniques have been proposed to partially address these SRAM design issues [40][41][42][43][44][45][46][47][48][49].…”
Section: Introductionmentioning
confidence: 99%
“…On the contrary, lowering cell supply voltage [47,48], word-line overdrive (WLOD), and raising VSS [38] will enhance WM while leading to deteriorated SNM. Another technique is using negative bit-line (NBL) [13,49] for WM enhancement.…”
Section: Introductionmentioning
confidence: 99%
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