Symposium 1988 on VLSI Circuits 1988
DOI: 10.1109/vlsic.1988.1037399
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A 50 dB variable gain amplifier using parasitic bipolar transistors in CMOS

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Cited by 19 publications
(11 citation statements)
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“…This technique achieves relatively small linearity error but with small dynamic range [8,9]. A possible method to generate the desired exponential function is to use parasitic bipolar transistors that are inherent in CMOS processes [10]. Although a parasitic bipolar transistor has an exponential characteristic, it is generally not preferred due to other unfavourable effects such as limited bandwidth, mismatches and strong temperature dependency.…”
Section: Introductionmentioning
confidence: 99%
“…This technique achieves relatively small linearity error but with small dynamic range [8,9]. A possible method to generate the desired exponential function is to use parasitic bipolar transistors that are inherent in CMOS processes [10]. Although a parasitic bipolar transistor has an exponential characteristic, it is generally not preferred due to other unfavourable effects such as limited bandwidth, mismatches and strong temperature dependency.…”
Section: Introductionmentioning
confidence: 99%
“…Circuit designers have come to realize that bipolar transistors inherent in submicron CMOS devices can be used to enhance circuit performance because of their high transconductance and cutoff frequency [2][3][4][5][6][7]. Since this approach requires no modification of the process, it is a cheap, widely applicable and relatively simple alternative.…”
Section: Introductionmentioning
confidence: 99%
“…In most cases a more or less elaborate transistor model was used, and the measurements were translated to variations of the model parameters that are hard to extrapolate to regions of operation where that model is no longer valid. Pan and Abidi [4] In this paper, considering that the MOS subthreshold region lacks a satisfactory mathematical model, especially in moderate inversion, we have decided to present results in the most direct manner, as drain current mismatch dis.,. tributions in MOS differential pairs.…”
Section: Introductionmentioning
confidence: 99%