2001
DOI: 10.1109/4.962293
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A 76-mm/sup 2/ 8-Mb chain ferroelectric memory

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Cited by 29 publications
(8 citation statements)
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“…[99], fast switching speed [100], and almost unlimited cycling endurance [101,102]. Figure 11g shows the MIM stack of FeRAM, where an insulating layer based on a ferroelectric (FE) material, typically in doped HfO 2 [103] or perovskite materials [104,105], is sandwiched between two metal electrodes. Its operation principle relies on the polarization switching within the FE layer due to the rotation of electrical dipoles under an external bias [106].…”
Section: Memristive Devices With 2-terminal Structurementioning
confidence: 99%
“…[99], fast switching speed [100], and almost unlimited cycling endurance [101,102]. Figure 11g shows the MIM stack of FeRAM, where an insulating layer based on a ferroelectric (FE) material, typically in doped HfO 2 [103] or perovskite materials [104,105], is sandwiched between two metal electrodes. Its operation principle relies on the polarization switching within the FE layer due to the rotation of electrical dipoles under an external bias [106].…”
Section: Memristive Devices With 2-terminal Structurementioning
confidence: 99%
“…Figure 2h shows the typical polarization-voltage (P-V) characteristic of an FERAM device, indicating that an applied positive voltage sweep results in the permanent polarization with remnant polarization +P r , while a negative sweep results in a permanent remnant polarization -P r . Typical FE materials for implementation in FERAM technology are PbZrTiO 3 (PZT), [114] BiSrTiO 3 (BST), [115] and doped HfO 2 , [116] the latter raising intense interest due to the large relevance of HfO 2 as a CMOS compatible material, extensively adopted as gate dielectric and RRAM material. While the polarization switching can be sensed by a transient displacement current, there is generally no variation of resistance of the FERAM, which therefore cannot be used as a resistive memory similar to other memory concepts in Figure 2.…”
Section: Stochastic Memristive Devicesmentioning
confidence: 99%
“…While the polarization switching can be sensed by a transient displacement current, there is generally no variation of resistance of the FERAM, which therefore cannot be used as a resistive memory similar to other memory concepts in Figure . Typical FE materials for implementation in FERAM technology are PbZrTiO 3 (PZT), BiSrTiO 3 (BST), and doped HfO 2 , the latter raising intense interest due to the large relevance of HfO 2 as a CMOS compatible material, extensively adopted as gate dielectric and RRAM material.…”
Section: Stochastic Memristive Devicesmentioning
confidence: 99%
“…The displacement current developed due to polarization switching is measured in FeRAM. 36,37 It is noteworthy that the dipole polarization switching does not change the resistance of the active material. By contrast, two ferromagnetic half-metallic electrodes, such as CoFeB, and insulating materials (e.g., MgO) in the MIM stack structure demonstrate STT-MRAM.…”
Section: Introductionmentioning
confidence: 99%