A Broadband and Stable Method for Unique Complex Permittivity Determination of Low-Loss Materials

Hasar, Uğur Cem; Westgate, Charles R.

doi:10.1109/tmtt.2008.2011242

Cited by 126 publications

(125 citation statements)

References 18 publications

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“…3(a) and 3(b) that ∂ε r /∂L x considerably decreases at multiple half-wavelengths. This is a similar tendency reported in [15,23,34]. The main reason of this can be the diminishing value of |S 11 | in (16) at multiple half-wavelengths.…”

Section: Uncertanty Analysissupporting

confidence: 88%

“…As another solution to the measurement errors arising from reflection S-parameters, we have lately proposed various amplitudeonly methods [22][23][24][25][26][27]. While the methods in [22,23,25] are proposed for ε determination of medium-and low-loss materials with substantiate lengths, those in [24,26] are for ε determination of high-loss materials which possess at least 10 dB attenuation. Although that in [27] is effective in eliminating the phase-shift problems for ε measurement of thin materials, it is not much applicable for dispersive materials since it assumes that electrical properties of thin materials do not considerably change with frequency.…”

Section: Introductionmentioning

confidence: 99%

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Permittivity Measurement of Thin Dielectric Materials From Reflection-Only Measurements Using One-Port Vector Network Analyzers

Hasar¹

2009

PIER

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Abstract-We have proposed a simple waveguide method for complex permittivity determination of dielectric materials which are not completely filling the entire sample holder. The method reconstructs the permittivity from measured reflection-only scattering parameters by a one-port vector network analyzer of two configurations of the sample holder. It not only eliminates the necessity of any knowledge of the location of the shifted sample inside its holder but also decreases measurement errors occurring with the presence of undesired air gaps, which seriously affect the measurement accuracy of transmissiononly measurements, present between the sample and holder walls. Furthermore, the reconstruction of permittivity can be realized by any one-port vector network analyzer, which is less expensive than their two-port counterparts. Therefore, the proposed method is cost-effective. We have analyzed the accuracy of the proposed method and noted a good compromise between the reference data and measured values of permittivities of low-loss polyvinyl-chloride and polytetrafluoro.ethylene samples (less than 8 percent for dielectric constant and less than 15 percent for loss tangent values).

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Section: Uncertanty Analysissupporting

confidence: 88%

Section: Introductionmentioning

confidence: 99%

Permittivity Measurement of Thin Dielectric Materials From Reflection-Only Measurements Using One-Port Vector Network Analyzers

Hasar¹

2009

PIER

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“…This resonance issue has been long recognized, and several efforts have been made to address it [5,[8][9][10]. All of these proposed methods, however, can only remove the artifacts for permittivities extracted with T/R methods at the λ/2 resonances.…”

Section: Introductionmentioning

confidence: 99%

An Approximate Approach to Determining the Permittivity and Permeability Near Lambda/2 Resonances in Transmission/Reflection Measurements

Kim¹,

Baker–Jarvis²

2014

PIER B

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Abstract-We present a simple and straightforward approximate approach to removing resonant artifacts that arise in the material parameters extracted near half-wavelength resonances that arise from transmission/reflection (T/R) measurements on low-loss materials. In order to determine material parameters near one such λ/2 resonance, by means of the 1st-order regressions for the input impedance of the sample-loaded transmission line, we approximate the characteristic impedance of the samplefilled section that is, in turn, dependent either on the relative wave impedance in a coaxial transmission line or on the relative permeability in a rectangular waveguide case. The other material parameters are then found, supplemented with the refractive index obtained from the conventional T/R method. This method applies to both coaxial transmission line and rectangular waveguide measurements. Our approach is validated by use of S-parameters simulated for a low-loss magnetic material, and is also applied to determine the relative permittivity and permeability from S-parameters measured for nylon and lithium-ferrite samples. The results are discussed as compared to those from the well-known Nicolson-Ross-Weir (NRW) method and are experimentally compared to those from the Baker-Jarvis (BJ) method as well.

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“…In order to measure general electrical properties of magnetic materials, the method in [33] can be employed. However, these methods [30][31][32][33] require a good initial guess for electrical properties of samples since complex exponential term in the expression of S 21 yields multiple solutions [26,32]. Measurements of two identical samples with different lengths can be utilized for unique ε r measurement of samples [10].…”

Section: Introductionmentioning

confidence: 99%

“…The presence of exponential terms in (1) simply produces multiple ε r solutions for a measured S 21 at one frequency [26,27,32]. In this paper, our aim is to first determine the thickness of the sample and then obtain an initial guess for the ε r using two measurements at two frequencies corresponding to extreme values of |S 21 |, and finally extract the ε r of the sample using complex S 21 measurements.…”

Section: Introductionmentioning

confidence: 99%

Microwave Method for Thickness-Independent Permittivity Extraction of Low-Loss Dielectric Materials From Transmission Measurements

Hasar¹

2010

PIER

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Abstract-A non-resonant microwave method has been proposed for complex permittivity determination of low-loss materials with no prior information of sample thickness. The method uses two measurement data of maximum/minimum value of the magnitude of transmission properties of the sample to determine an initial guess for permittivity and find the sample thickness. An explicit expression for sample thickness and two expressions for inversion of the complex permittivity of the sample are derived. The method has been validated by transmission measurements at X-band (8.2-12.4 GHz) of a low-loss sample located into a waveguide sample holder.

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A Broadband and Stable Method for Unique Complex Permittivity Determination of Low-Loss Materials

Cited by 126 publications

References 18 publications

Permittivity Measurement of Thin Dielectric Materials From Reflection-Only Measurements Using One-Port Vector Network Analyzers

Permittivity Measurement of Thin Dielectric Materials From Reflection-Only Measurements Using One-Port Vector Network Analyzers

An Approximate Approach to Determining the Permittivity and Permeability Near Lambda/2 Resonances in Transmission/Reflection Measurements

Microwave Method for Thickness-Independent Permittivity Extraction of Low-Loss Dielectric Materials From Transmission Measurements

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