A built-in self-test for ADC and DAC in a single-chip speech CODEC

Teraoka, E.; Kengaku, T.; Yasui, I.; Ishikawa, Kazuhiko; Matsuo, Takahiro; Wakada, H.; Sakashita, N.; Shimazu, Y.; Tokuda, T.

doi:10.1109/test.1993.470623

Cited by 60 publications

(19 citation statements)

References 5 publications

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“…BIST techniques that allow performing an FFT analysis on-chip [18,19] rely on the availability of a DSP core. Some BIST approaches employ more defect-oriented measurements avoiding the extraction of converter performance parameters [20,21].…”

Section: Reviewmentioning

confidence: 99%

Flexible embedded test solution for high-speed analogue front-end architectures

Lechner¹,

Burbidge²,

Richardson³

2004

IEE Proc., Circuits Devices Syst.

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A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.

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Section: Reviewmentioning

confidence: 99%

Flexible embedded test solution for high-speed analogue front-end architectures

Lechner¹,

Burbidge²,

Richardson³

2004

IEE Proc., Circuits Devices Syst.

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“…The HBIST concept [26] includes an on-chip TSG that converts digital test patterns to a test stimulus, and is realised by the reconfiguration of cells already present to perform the digital BIST. Other concepts suitable for mixed signal circuits where the digital kernel is surrounded with analogue sub-circuits on the input and output, are the MADBIST concept for Σ∆ converters [27] and a BIST for the converters on a single-chip CODEC [28]. The OBIST technique [29], suitable for both functional and defect oriented testing, is based on the oscillation test methodology.…”

Section: State-of-the-art In Analogue and Mixedsignal Design For Testmentioning

confidence: 99%

A digital partial built-in self-test structure for a high performance automatic gain control circuit

Lechner

Ferguson

Richardson

et al. 1999

Proceedings of the Conference on Design, Automation and Test in Europe

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“…The HBIST concept 26 includes an onchip TSG that converts digital test patterns to a test stimulus, and is realised by the reconfiguration of cells already present to perform the digital BIST. Other concepts suitable for mixed signal circuits where the digital kernel is surrounded with analogue sub-circuits on the input and output, are the MADBIST concept for Σ∆ converters 27,28,29 and the BIST for the converters on a single-chip CODEC 30 . The OBIST technique 31 , suitable for both functional and defect oriented testing, is based on the oscillation test methodology.…”

Section: State-of-the-art In Analogue and Mixed Signal Testingmentioning

confidence: 99%