We studied the roles of lightly doped carbon in a series of n-GaN Schottky diode epitaxial structures on freestanding GaN substrates, and evaluated the effects of the doping on diode performances. A large variation of compensation ratio was observed for carbon doping at (1-2) ' 10 16 cm %3 . A model was proposed to explain this phenomenon, in which a vulnerable balance between donor-type C Ga and deep acceptor C N strongly affected the free-carrier generation. Application of Norde plots and reverse biased leakage current in current-voltage measurements suggested provisional optimization for a free-carrier concentration of 8 ' 10 15 cm %3 to achieve a tradeoff between breakdown voltage and onresistance of the n-GaN diodes.