A CAT Tool for Frequency-domain Testing and Diagnosis on Analog

Abstract

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A method to diagnose faults in linear analog circuits using an adaptive tester

“…Some faults affecting components R2, R3 and C2 have proven equivalent. In fact, this just confirms the conclusion drawn in [2] that these faults lead to similar faulty behaviors in a broad range of frequencies.…”

“…These faults cause strong changes in behavior since circuits are moved out of the linear region of operation. Diagnosis experiments based on sensitivity analysis [2] had already shown in the past that the detection regions for those faults may be very similar for many components of the CUT. That is the reason why we are now focusing our research work on finding a model that is capable of dealing with this situation.…”

“…If diagnosis is not a concern, the individual frequency subsets can be merged together, in such a way that a smaller set of test stimuli is obtained. [2] also applies sensitivity analysis to analog circuits, but generates a minimal subset of input-parameter pairs that simultaneously maximizes fault detection and fault diagnosis.…”

A new adaptive analog test and diagnosis system

“…If diagnosis is not a concern, the individual frequency subsets can be merged together, in such a way that a smaller set of test stimuli is obtained. [2] also applies sensitivity analysis to analog circuits, but generates a minimal subset of input-parameter pairs that simultaneously maximizes fault detection and fault diagnosis. Other existing test generation techniques are ad-hoc methods, thus devoted to specific circuit classes (see, for example, [3]).…”