2013
DOI: 10.1002/rds.20044
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A clamped dual‐ridged waveguide measurement system for the broadband, nondestructive characterization of sheet materials

Abstract: [1] A novel two-port probe which uses dual-ridged waveguides for the nondestructive, broadband characterization of sheet materials is presented. The new probe is shown to possess approximately 2 to 3 times the bandwidth of traditional coaxial and rectangular/circular waveguide probe systems while maintaining the structural robustness characteristic of rectangular/circular waveguide probe systems. The theoretical development of the probe is presented, namely, by applying Love's equivalence theorem and enforcing… Show more

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Cited by 11 publications
(13 citation statements)
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“…The analytical forms for these field distributions can be found in [4] and are not provided here for the sake of brevity.…”
Section: Drwg and Parallel-plate Region Field Distributionsmentioning
confidence: 99%
“…The analytical forms for these field distributions can be found in [4] and are not provided here for the sake of brevity.…”
Section: Drwg and Parallel-plate Region Field Distributionsmentioning
confidence: 99%
“…The dramatic benefit of using dual-ridged waveguides is a three-fold improvement in bandwidth (and hence, three-fold improvement in resolution). This effort will build upon other work related to dual-ridged waveguides, namely, single and clamped probe research performed by [19,20], which considered dominant-mode propagation only.…”
Section: Problem Statementmentioning
confidence: 99%
“…In addition to there robustness, rectangular and circular waveguides do not have the coupling problems previously noted for coaxial waveguides. [21] as well as clamped systems [20] showing the ability to accurately characterize simple materials with approximately 3 times the bandwidth of a traditional X-band waveguide.…”
Section: Rectangular and Circular Waveguidesmentioning
confidence: 99%
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