“…Several techniques have been developed to alleviate this problem such as two thickness method [9,10,26,33], two layer method [3,14,26,34], frequency varying method [26,35], free space backed method [3,25,34], and two iris method [13]. However, these techniques have disadvantages such as instability (two layer method), physically difficult to measure (free space backed method), require prior knowledge of the MUT (two thickness and frequency varying methods), or require two waveguides (two iris method) [20]. As mentioned previously, the accommodation of higher-order modes in a dual-ridged single probe waveguide for the purpose of enhancing material property extraction is investigated as part of this research effort, and is discussed in Chapter 3.…”