2023
DOI: 10.36227/techrxiv.24604479.v1
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A Clustering-BIST Design for Inter-Layer Vias in 3D ICs Based on Walking Pattern Approach

Ahmad Menbari,
Hemin Rahimi,
Hadi Jahanirad
et al.

Abstract: <p> In the realm of 3D monolithic integrated circuits,  inter-layer vias are prone to defects during fabrication, assembly,  and operation that necessitate robust Built-In Self-Test solutions. This paper introduces an innovative BIST design aimed at the detection and localization of different types of faults in irregularly placed ILVs using a walking pattern methodology.  In the proposed BIST methodology, the ILVs are clustered based on the fault occurrence probability distribution. Then, an effective de… Show more

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