2020
DOI: 10.1063/5.0002049
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A combined approach of atom probe tomography and unsupervised machine learning to understand phase transformation in (AlxGa1−x)2O3

Abstract: In this paper, we investigated the evolution of microstructural chemistry of metal organic chemical vapor deposition grown (010) (AlxGa1−x)2O3 films with varying Al contents, x = 0.10–1.0, using atom probe tomography (APT). At a low Al content (x ≤ 0.25), the films are homogeneous, where layer inhomogeneity appears at a high Al content (x > 0.25). Further increasing the Al content up to x ≥ 0.60 results in a homogeneous (AlxGa1−x)2O3 layer. This change in microstructural features was linked to the phase… Show more

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Cited by 25 publications
(18 citation statements)
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“…Since wide bandgap semiconductor tips may exhibit poor response to laser pulsing, it is critical to optimize the APT experimental conditions, especially the base specimen temperature and pulse energy beforehand [80]. Experimental parameters including temperature (K), pulse repetition rate (kHz), laser pulse energy (pJ), and evaporation rate (ions per pulse) were optimized to ensure efficient data acquisition from (Al x Ga 1−x ) 2 O 3 tips containing layered structure with varying Al content [28,29,87,88]. The evaporated ions from individual layers are projected and collected in a position-sensitive detector (PSD) that provides the TOF and detection event in 2D positions [89] which is used in the reconstruction of the 3D tip image and data analysis.…”
Section: Data Acquisitionmentioning
confidence: 99%
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“…Since wide bandgap semiconductor tips may exhibit poor response to laser pulsing, it is critical to optimize the APT experimental conditions, especially the base specimen temperature and pulse energy beforehand [80]. Experimental parameters including temperature (K), pulse repetition rate (kHz), laser pulse energy (pJ), and evaporation rate (ions per pulse) were optimized to ensure efficient data acquisition from (Al x Ga 1−x ) 2 O 3 tips containing layered structure with varying Al content [28,29,87,88]. The evaporated ions from individual layers are projected and collected in a position-sensitive detector (PSD) that provides the TOF and detection event in 2D positions [89] which is used in the reconstruction of the 3D tip image and data analysis.…”
Section: Data Acquisitionmentioning
confidence: 99%
“…The change in the atomic-level structure and chemical composition of (Al x Ga 1−x ) 2 O 3 at Al content, x > 0.25, results in a degraded crystallinity of the films [28,29,87,88] limiting the solubility of α-Al 2 O 3 in β-Ga 2 O 3 . This crystal degradation was attributed to the phase separations in (Al x Ga 1−x ) 2 O 3 at high Al content [10,26,28,29,30]. Since the phase purity is related to film's homogeneity with well-defined Al/Ga stoichiometry at the atomic level, it is required to study the change in the atomic-level structure and chemistry of (Al x Ga 1−x ) 2 O 3 with Al to conclusively determine the Al solubility limit in this alloy.…”
Section: Phase Transformations Of (Almentioning
confidence: 99%
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“…The first step is to divide the sample into multiple sections, and each section will have a respective TOF spectrum as shown in (b-k). Reprinted from Ref [29]. with the permission of AIP Publishing.Invited Feature Paper -Review ▪ Journal of Materials Research ▪ 2020 ▪ www.mrs.org/jmr © The Author(s), 2020, published on behalf of Materials Research Society by Cambridge University Press cambridge./www.cambridge.org/core/terms.…”
mentioning
confidence: 99%
“…The flow chart illustrating the algorithm used to perform PCA on the TOF of (Al x Ga 1−x ) 2 O 3 films with x = 0.1-1.0. Reprinted from Ref [29]. with the permission of AIP Publishing.…”
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confidence: 99%