A Compact Variable-Temperature Broadband Series-Resistor Calibration

Orloff, Nathan D.; Mateu, Jordi; Lewandowski, Arkadiusz; Rocas, Eduard; King, Jonathan; Gu, Dazhen; Lü, Xiaoli; Collado, C.; Takeuchi, Ichiro; Booth, James C.

doi:10.1109/tmtt.2010.2091200

Cited by 38 publications

(19 citation statements)

References 17 publications

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“…We then obtained the distributed capacitance and conductance per unit length for the IDC device directly from the slope. For the high frequency measurement between 100 MHz and 40 GHz, we used the multiline thru-reflect-line algorithm [25,26] to extract the capacitance and conductance per unit length as a function of frequency for the coplanar waveguide device geometry [27,28]. For the measurement between 1 kHz and 40 GHz, we used on-wafer error correction, using a custom calibration standard fabricated on a reference wafer [27].…”

Section: Experimental and Calculation Detailsmentioning

confidence: 99%

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1Ti
Goian
¹
,
Kamba
²
,
Orloff
³

et al. 2014
Phys. Rev. B
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2
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0
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Recently, Lee et al. [Nature (London) 502, 532 (2013)] used ß1% tensile strain to induce a ferroelectric instability in thin films of Sr n+1 Ti n O 3n+1 (n = 1 − 6) phases. They showed that the Curie temperature T C gradually increased with n, reaching 180 K for Sr 7 Ti 6 O 19 (n = 6). The permittivity of this (n = 6) sample could also be tuned significantly by the application of an electric field with exceptionally low dielectric loss at 300 K, rivaling all known tunable microwave dielectrics. Here, we present microwave (MW), terahertz, and infrared spectra of strained Sr n+1 Ti n O 3n+1 thin films deposited on (110) DyScO 3 . Near the ferroelectric phase transitions, we observe the splitting and shifting of phonon and central mode frequencies, demonstrating the change of crystal symmetry below T C . Moreover, our spectra reveal that the central mode contribution dominates MW loss. In the Sr 7 Ti 6 O 19 thin film, the central mode vanishes at 300 K, explaining its low MW loss. Finally, we discuss the origin and general conditions for the appearance of central modes near ferroelectric phase transitions.

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Section: Experimental and Calculation Detailsmentioning

confidence: 99%

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1Ti
Goian
¹
,
Kamba
²
,
Orloff
³

et al. 2014
Phys. Rev. B
Self Cite
13
2
8
0
View full text Add to dashboard Cite

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“…Figure 10(b) shows |δZ max | for the SBC procedure. It has been calculated by using the random errors on the refection coefficients and the systematic errors on the references as previously determined (see equations (19), (20) and (22)). Although the error on the SC could probably be minimized by optimizing the experimental set-up for this specific calibration, there is almost a difference of three orders of magnitude in the obtained |δZ max | between the two calibrations.…”

Section: Error On the Calibrationmentioning

confidence: 99%

Sample-based calibration for cryogenic broadband microwave reflectometry measurements

et al. 2019

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The characteristic frequencies of a system provide important information on the phenomena that govern its physical properties. In this framework, there has recently been renewed interest in cryogenic microwave characterization for condensed matter systems since it allows to probe energy scales of the order of a few µeV. However, broadband measurements of the absolute value of a sample response in this frequency range are extremely sensitive to its environment and require a careful calibration. In this paper, we present an in situ calibration method for cryogenic broadband microwave reflectometry experiments that is both simple to implement and through which the effect of the sample electromagnetic environment can be minimized. The calibration references are here provided by the sample itself, at three reference temperatures where its impedance is assumed or measured, and not by external standards as is usual. We compare the frequency-dependent complex impedance (0.1-2 GHz) of an a-Nb15Si85 superconducting thin film obtained through this Sample-Based Calibration (SBC) and through an Open-Short-Load Standard Calibration (SC) when working at very low temperature (0.02-4 K) and show that the SBC allows us to obtain the absolute response of the sample. This method brings the calibration planes as close as possible to the sample, so that the environment electrodynamic response does not affect the measurement, provided it is temperature independent. This results in a heightened sensitivity, for a given experimental set-up.

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“…The resistor, pad, and conductor layers were deposited by electron-beam evaporation and lifted off via a two-layer resist process [31]. First, we deposited a 1-nm Ti adhesion layer followed by 10 nm of PdAu for the resistor [32]. Next, a 10-nm Ti adhesion layer was deposited followed by 100 nm of Pd for the pads.…”

Section: Fabrication Of the Microwave-microfluidic Devicementioning

confidence: 99%

A Multistate Single-Connection Calibration for Microwave Microfluidics

Orloff

Little

et al. 2018

IEEE Trans. Microwave Theory Techn.

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Abstract-With emerging medical, chemical, and biological applications of microwave-microfluidic devices, many researchers desire a fast and accurate calibration that can be achieved in a single connection. However, traditional on-wafer or coaxial calibrations require measurements of several different artifacts to the data prior to measuring the microwave-microfluidic device. Ideally, a single artifact would be able to present different impedance states to correct the vector network analyzer data, minimizing drift and eliminating artifact-to-artifact connection errors. Here, we developed a multistate single-connection calibration that used a coplanar waveguide loaded with a microfluidic channel. We then used measurements of the uncorrected scattering parameters of the coplanar waveguide with the channel empty, filled with deionized water, and filled with 30 w% (30 grams per liter) of saline to construct an eight-term error model and switch-term correction. After correction, the residuals between measured scattering parameters and with literature-based finite-element simulations were below -40 dB from 100 MHz to 110 GHz. This multistate single-connection calibration is compatible with both wafer-probed and connectorized microwave-microfluidic devices for accurate impedance spectroscopy and materials characterization without the need for multiple device measurements.

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A Compact Variable-Temperature Broadband Series-Resistor Calibration

Cited by 38 publications

References 17 publications

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1Ti
Goian
¹
,
Kamba
²
,
Orloff
³

et al. 2014
Phys. Rev. B
Self Cite
13
2
8
0
View full text Add to dashboard Cite

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1Ti
Goian
¹
,
Kamba
²
,
Orloff
³

et al. 2014
Phys. Rev. B
Self Cite
13
2
8
0
View full text Add to dashboard Cite

Sample-based calibration for cryogenic broadband microwave reflectometry measurements

A Multistate Single-Connection Calibration for Microwave Microfluidics

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A Compact Variable-Temperature Broadband Series-Resistor Calibration

Cited by 38 publications

References 17 publications

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1TiGoian1, Kamba2, Orloff3 et al. 2014Phys. Rev. BSelf Cite13280View full textAdd to dashboardCite

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1TiGoian1, Kamba2, Orloff3 et al. 2014Phys. Rev. BSelf Cite13280View full textAdd to dashboardCite

Sample-based calibration for cryogenic broadband microwave reflectometry measurements

A Multistate Single-Connection Calibration for Microwave Microfluidics

Contact Info

Product

Resources

About

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1Ti
Goian
¹
,
Kamba
²
,
Orloff
³

et al. 2014
Phys. Rev. B
Self Cite
13
2
8
0
View full text Add to dashboard Cite

Influence of the central mode and soft phonon on the microwave dielectric loss near the strain-induced ferroelectric phase transitions inSrn+1Ti
Goian
¹
,
Kamba
²
,
Orloff
³

et al. 2014
Phys. Rev. B
Self Cite
13
2
8
0
View full text Add to dashboard Cite