A Comparative Analysis of Two Dielectric Extraction Methods of a PCB Material for D-Band Applications

Kanitkar, Abhijeet; Ndip, Ivan; Chernobryvko, Mykola; Köszegi, Julia-Marie; Schwanitz, Oliver; Schuster, Martin

doi:10.1109/estc55720.2022.9939494

Cited by 7 publications

(1 citation statement)

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“…In our case a split-cylinder resonator was employed. The detailed description of the characterization methods is out of the scope of the present paper and presented in [5][6][7]. The data from the pure dielectric characterisation is displayed in Figure 5.…”

Section: Rf Analysis Of Pure Dielectric Analysismentioning

confidence: 99%

Analysis of the Impact of Environmental Conditions on the Reliability in 5G PCB Assemblies

Walter,

Wittler,

van Dijk

et al. 2024

IMAPSource Proceedings

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The designs of integrated systems are increasingly compact while the requirements of application, especially in the automotive sector, remain demanding. One main challenge is posed by the environmental conditions. In the present study, their impact on mmWave 5G PCB assemblies is evaluated with respect to both mechanical and highfrequency properties. To that end, material samples were stored at three temperatures for various durations in order to accelerate the ageing effects. Afterwards, the samples were tested by use of mechanical, dielectric and high-frequency test methods. Thermo-oxidative ageing processes were observed and lead to significant changes in mechanical and dielectric properties, with simultaneous changes of sample color. The combined approach of mechanical and high-frequency analysis allows for three innovative advantages: First, a correlation of the degradation in performance with other parameters, e.g. sample change of color, which is much easier to detect. Second, the definition of a Safe Area of Operation and a methodology to estimate the behaviour of a mmWave 5G PCB assembly over its lifetime. Finally, the study opens the pathway to a design for robustness of mmWave communication system in automotive applications.

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Section: Rf Analysis Of Pure Dielectric Analysismentioning

confidence: 99%