2006
DOI: 10.1088/0963-0252/15/3/004
|View full text |Cite
|
Sign up to set email alerts
|

A comparative study on the performance of a xenon capillaryZ-pinch EUV lithography light source using a pinhole camera

Abstract: A pinhole camera has been employed to study the performance of a xenon capillary Z-pinch extreme ultraviolet (EUV) lithography light source driven by different dI/dt discharge current pulses. The performance of the EUV source in terms of dimension, intensity, collection efficiency and stability was specifically investigated by varying the experimental conditions such as the supplying gas pressure and dI/dt of the discharge current. Specific features, such as ring shape (annular profile) pinhole images and symm… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2009
2009
2014
2014

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 11 publications
(3 citation statements)
references
References 15 publications
0
3
0
Order By: Relevance
“…Capillary discharge is known for its capability to produce moderately hot ionised plasma which emits in the EUV range of wavelength [1][2][3][4][5][6][7][8][9][10][11].For this reason, capillary discharge operated at different modes has been investigated as light sources. The modes of operation which have been investigated include the ablative and gasfilled modes as soft X-ray and EUV sources.…”
Section: Introductionmentioning
confidence: 99%
“…Capillary discharge is known for its capability to produce moderately hot ionised plasma which emits in the EUV range of wavelength [1][2][3][4][5][6][7][8][9][10][11].For this reason, capillary discharge operated at different modes has been investigated as light sources. The modes of operation which have been investigated include the ablative and gasfilled modes as soft X-ray and EUV sources.…”
Section: Introductionmentioning
confidence: 99%
“…Because of the complex nature and extreme conditions produced in the EUV plasma sources, several plasma diagnostics are needed to fully characterize these extreme ultraviolet lithography (EUVL) sources. This paper describes the development and employment of some EUV diagnostics at Tokyo Institute of Technology for characterizing the EUV emission from the pulsed plasma systems namely, capillary [12,13] and gas jet Z-pinch [14,15]. The performance of these EUV emitting sources have been investigated in terms of various technological aspects of EUV lithography.…”
Section: Introductionmentioning
confidence: 99%
“…Pulsed capillary discharges (PCDs) are versatile transient plasma devices which are currently being used in different applications, where a high aspect ratio, dense transient plasma is required. These applications include lasing in the extreme ultraviolet (EUV) [1][2][3], waveguiding for high power laser pulses [4,5], high harmonic generation [6], EUV sources for lithography [7][8][9][10][11][12] and plasma jets production [13][14][15][16]. Different initiation mechanisms are used in PCD, depending on the particular application.…”
Section: Introductionmentioning
confidence: 99%