2022 44th Annual EOS/ESD Symposium (EOS/ESD) 2022
DOI: 10.23919/eos/esd54763.2022.9928519
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A Comparison between Low Impedance Contact CDM and Field Induced CDM: Measurement and Simulation

Junsik Park
1
,
Heesu Kim
2
,
Dong-Gwan Yoon
3
et al.
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