A comparison between /sup 60/Co ground tests and CRRES space flight data

Abstract

This paper presents results of microelectronic device degradation due to total dose as measured on the Combined Release and Radiation Effects Satellite (CRRES). The on-orbit device performance is compared to MIL-STD-883 Method 1019.2 @' CO ground test performance on like devices. Although experimental factors introduce uncertainties, the comparisons show that space degradation reasonably matches high dose rate @'CO testing for many part types, while other part types show significant differences. However, even where differences exist, the degradation is within a factor of three between the space and ground tested parts. Due to the vintage of the parts flown and the unexpectedly short duration of the mission, the space results do not provide a basis for evaluating the changes incorporated into the new MIL-STD-883 Method 1019.4 which addresses dose rate effects in more detail.

Gamma irradiation-induced absorption in single-domain and periodically-poled KTiOPO_4 and Rb:KTiOPO_4

“…For instance, the radiation dose measured on a satellite in a geostationary orbit (altitude of about 36000 km) was measured to be 50 krad/year by a dosimeter, which was shielded by a 1.89-mm-thick Al sheet [35]. Measurements on the satellite, with the highly elliptical orbit traversing van Allen radiation belts, gave the effective radiation dose of 135 krad/year under 2-mm thick Al shielding [36]. The majority of the Earth observation satellites, including passive atmospheric gas sensors (ENVISAT, OCO-2, GOSAT), are launched in the low Earth close to polar orbits (altitude of 100 −1000 km) where the expected radiation dose is much lower, about 2 krad/year for 2-mm-thick Al shielding [37].…”