Numerous field failures are observed in photovoltaic (PV) modules that pass standardized design qualification and type approval testing. Standardized tests are typically mechanism-specific and only developed after the failure mode has caused extensive trouble in the field. For example, technical papers emerged in 1977 that showed PV module susceptibility to system voltage in humid conditions, presently referred to as potential-induced degradation (PID). [1,2] Methods for PID testing were proposed in 1978 but not widely implemented. [3] While some work continued in thin film technology, [4] the phenomenon was largely ignored until field failures with various PID types were extensively reported. The PID issue led to a great deal of financial cost in the 2005 to 2015 timeframe. [5,6] Field-relevant PID test methods were agreed upon and standardized in IEC 62 804-1 in 2015 [7] and incorporated into IEC 61 215 qualification testing in 2021, [8] which is 44 years after the first publications about PID. Faulty products were produced, shipped, and sold with many consumers unaware of the issue. Other examples of degradation modes discovered after extensive shipments of PV modules include light and elevated temperature induced degradation (LETID), an important degradation mode in modules with passivated emitter and rear contact (PERC) cells, [9][10][11] and cracking of polyamide (PA) and certain polyvinylidene fluoride (PVDF)-based backsheets. [12,13] With the discovery of new degradation or failure mechanisms, numerous tests were added to comprehensively examine these