2016
DOI: 10.1016/j.nima.2016.03.083
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A comparison of lower and higher LET heavy ion irradiation effects on silicon NPN rf power transistors

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Cited by 5 publications
(2 citation statements)
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“…The thickness of the emitter (n + ) is ≈ 1 µm and the base (p + ) thickness is ≈ 2 µm (13,14). Figure 1 shows the cross-sectional view of the transistors used for the present research work.…”
Section: Methodsmentioning
confidence: 99%
“…The thickness of the emitter (n + ) is ≈ 1 µm and the base (p + ) thickness is ≈ 2 µm (13,14). Figure 1 shows the cross-sectional view of the transistors used for the present research work.…”
Section: Methodsmentioning
confidence: 99%
“…Swift heavy ions (SHI) are well known to modify characteristics of the materials (Kuzmann et al, 2023;Wu et al, 2023) and devices such as spintronics (Singh et al, 2016;Zhao et al, 2019), electronic (Bharathi et al, 2016; and sensing (Ramola et al, 2022). These ions have the potential to design ferrites for spintronic (Garg et al, 2023) and gas sensing applications (Bagwan et al, 2022).…”
Section: Swift Heavy Ionsmentioning
confidence: 99%