A comparison of plasma generation, plasma transport, and film formation for a DC vacuum arc source with Ti–X compound cathodes (X = W, C, Al, and Si)

Abstract

This investigation reports the influence of Ti–C and Ti–W cathode composition on an industrial-scale dc vacuum arc plasma source. Further, we analyze the influence of plasma generation and plasma properties on the resulting cathode surface after the operation and on basic film properties. The results are compared with previous work focused on Ti–Al and Ti–Si compound cathodes. For all Ti–X compound cathodes (X = W, C, Al, and Si), a direct correlation between plasma ion energy/charge and the cohesive energy of the cathode was demonstrated, with a small number of exceptions to a limited set of specific cathode compositions. Hence, the “velocity rule” and effects from different electron temperatures were suggested to be important for gaining a more detailed understanding of plasma properties. A discrepancy was found between the cathode and plasma ion composition, though the difference was reduced in a corresponding comparison between the cathode and the deposited film composition. A significant contribution of a flux of neutrals and/or macroparticles to the final film composition was, therefore, suggested. The effect of the melting point of the cathode phase composition on the intensity of macroparticle generation and the smoothness of the cathode surface operation was also investigated. The presented results contribute to the fundamental understanding of vacuum arc plasma generation and transport and are of importance for further development and applicability of Ti-based coatings from arc deposition.

Study on the properties of deuterium ions in a composite cathode vacuum arc discharge

“…A vacuum arc discharge with a composite cathode can produce multi-component ions that are widely used in vacuum arc ion sources, surface modification, space propulsion and other fields [1][2][3][4][5]. Composite deuterium-saturated cathodes have an using time-of-flight mass spectrometer methodology [6,8,10,11,[13][14][15][16][17].…”