“…The sharp diffraction peaks (28.4 °, 47.3 °, 50.1 °, 69.1 °, 76.3 °) correspond to the characteristic crystal planes ((111), (220), (311), (400), (331)) of Si crystallites, respectively 36 . And the relatively broad and weak two peaks at around 23 ° and 43 ° are 5 derived from the crystallographic planes (002) and (100), respectively, for PAN-based carbon 40,41 . The porous structure of Si/po-C@C composite is determined by the nitrogen isothermal adsorption/desorption measurement, as shown in Figure S5a.…”