A comprehensive review and side channel attack analysis on radiation-tolerant SRAM cells for aerospace, terrestrial and nuclear applications
Soumya Sengupta,
Arjun Singh Yadav
Abstract:In memory, single event upset (SEU) and single event multiple node upset
(SEMNU) have become the principal problems during the past four decades.
Significant dependability issues arise from these upsets in a variety of
applications such as space, terrestrial, military, and healthcare
sector. The use of scaled on-chip memory devices to store private and
sensitive data has grown dramatically in the last several years across
all the sectors. Memory devices are seriously at risk from non-invasive
side-channel assa… Show more
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