2018
DOI: 10.11591/ijeecs.v12.i3.pp941-949
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A Comprehensive Review on Applications of Don’t Care Bit Filling Techniques for Test Power Reduction in Digital VLSI Systems

Abstract: Massive power consumption during VLSI testing is a serious threat to reliability concerns of ubiquitous silicon industry. A significant amount of low-power methodologies are proposed in the relevant literature to address this issue of test mode power consumption and don’t care bit(X) filling approaches are one of them in this fraternity. These don’t care(X) bit filling techniques have drawn the significant attention of industry and academia for its higher compatibility with existing design flow as neither modi… Show more

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Cited by 2 publications
(2 citation statements)
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“…Non-scan cells are the cells which don't involve in scan mode, for this there are multiple explanations. One of the reasons is some cells and IPs are provided by third parties which intend those vendors don't want their IPs to be scanned for security purposes, and power consumption [17] in scan mode can be reduced. If timing analysis is performed for these cells they all will be reported for timing, this process will take additional time and effort to segregate results and reports.…”
Section: Primetime Flow To Generate the Dft Timing Constraintsmentioning
confidence: 99%
“…Non-scan cells are the cells which don't involve in scan mode, for this there are multiple explanations. One of the reasons is some cells and IPs are provided by third parties which intend those vendors don't want their IPs to be scanned for security purposes, and power consumption [17] in scan mode can be reduced. If timing analysis is performed for these cells they all will be reported for timing, this process will take additional time and effort to segregate results and reports.…”
Section: Primetime Flow To Generate the Dft Timing Constraintsmentioning
confidence: 99%
“…In other words, if an outcome is not detected under such situations, i.e. if it has observable don't care (ODC) situations, then it is possible to insert transparent latches or floating gates at the required input [28]- [31].…”
Section: Techniques For Dynamic-power Optimizationmentioning
confidence: 99%