Zn-Ir-O has hardly ever been systematically investigated in a wide Ir concentration range. Therefore, in this study, we employ X-ray diffraction, X-ray absorption spectroscopy (XAS), and Raman spectroscopy techniques to investigate the structure of Zn-Ir-O films (up to %70 at% Ir) deposited by reactive DC magnetron co-sputtering. Reverse Monte Carlo (RMC) simulations of the Zn K-edge EXAFS spectra are performed to study the local structure of Zn ions. The electrical conductivity, as well as the thermoelectric measurements, are also presented to determine the electrical conductivity of the films and to observe the transition from n-type to p-type conductivity. To evaluate the structure of films deposited at higher temperatures and the thermal stability of p-type conductivity, the films are also deposited at 300 C.