Amorphous materials have shown remarkable properties for the fabrication of superconducting single photon detectors in different wavelength range. In this work, we have deposited four films with a thickness of 5 nm, from different amorphous materials, namely WGe, WSi, MoGe, and MoSi. Through comprehensive analyses of the properties of the materials, we investigate their fundamental parameters and characteristic interaction times, derived from magnetoconductivity measurements in a physical property measurement system. By comparing them, we aim to provide a deeper understanding of their suitability for superconducting strip photon detectors applications. Specifically, our findings highlight similarities between WGe and MoGe with their counterparts based on silicon, which are already established materials to produce superconducting detectors capable of operating at extended wavelengths.