A compton peak method for incident angle determination in XRF with annular excitation

Greaves, E.D.; Bohus, L. Sajo; Marcó, L.; Alvarez, M.

doi:10.1002/xrs.1300210306

Cited by 5 publications

(1 citation statement)

References 10 publications

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“…However, because of a broad geometry, evaluation of the angles is not a trivial task and can be done either theoretically or experimentally. 20,21 A flexible Monte Carlo procedure was proposed 8 to calculate the effective incident and take-off angles as a function of the sample composition and thickness. The same method was used to calculate a distribution of the excitation-detection efficiency and a total efficiency of a radioisotope-excited XRF setup which appeared to be extremely useful in the design and optimisation of a portable and laboratory XRF spectrometer.…”

Section: Methodological Developments In Xrf Analysismentioning

confidence: 99%

Activities in the IAEA X‐ray fluorescence laboratory at Seibersdorf

et al. 2006

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This paper describes the specific philosophy behind the functioning of the IAEA XRF Laboratory at Seibersdorf and its role in the XRF community. Some examples of the research and development activities and the results obtained are given. They include methodological development and construction of XRF instruments in order to extend the applicability range of the XRF technique, particularly in support of applications of the analytical technique in developing IAEA member states. The contribution of the laboratory to the training in methodology and applications of XRF techniques and to development of QA/QC procedures is also emphasised.

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Section: Methodological Developments In Xrf Analysismentioning

confidence: 99%

Activities in the IAEA X‐ray fluorescence laboratory at Seibersdorf

et al. 2006

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Simultaneous determination of rare earths by x‐ray fluorescence spectrometry using a fundamental parameters method

Parra¹,

Greaves²,

Paz³

et al. 1993

X-Ray Spectrometry

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Concentrates extracted from a lateritic mineral deposit were analysed for their rare earth (RE) content by energy‐dispersive x‐ray fluorescence (XRF) spectrometry. The L emission lines of the lanthanides were excited with the 22.1 keV Ag K radiation from an annular Cd‐109 radioisotope source. The problem of the extensive overlap of the L lines were solved by the AXIL program for deconvolution of XRF spectra. Individual REs were quantified by preparing semi‐transparent pellets of the concentrate with starch which served as dilutant and binder. This allowed correction for sample absorption with the light matrix program of the QXAS analysis package based on the fundamental parameter method. The method allowed the simultaneous determination of 12 rare earths contained in the sample, with a reproducibility of 2.0–29% and accuracy in the range 1.5–24% relative error without the use of standard materials. Detection limits achieved were in the range of 340 ppm for the heavy REs and 4000 ppm for the light REs.

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Determination of incident angle in radioisotope‐excited EDXRF

Somogyì

Pazsit

1993

X-Ray Spectrometry

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Three different methods were used for the determination of the effective incident angle related to EDXRF when radioisotope annular sources are involved: weighted averaging, Compton peak method and minimization of the difference between the certificated and measured concentrations of six international standard samples. By measuring the Compton peak energies of various analytical reagent grade elements and compounds, it was round that the incoherent peak energy depends on the mean atomic number of the matrix, so the effective incident angle is also matrix dependent. = K edge jump ratio; = fluorescence yield of the K shell;A. SOMOGYI AND A PAZSIT

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A compton peak method for incident angle determination in XRF with annular excitation

Cited by 5 publications

References 10 publications

Activities in the IAEA X‐ray fluorescence laboratory at Seibersdorf

Activities in the IAEA X‐ray fluorescence laboratory at Seibersdorf

Simultaneous determination of rare earths by x‐ray fluorescence spectrometry using a fundamental parameters method

Determination of incident angle in radioisotope‐excited EDXRF

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