2020 10th International Conference on Computer and Knowledge Engineering (ICCKE) 2020
DOI: 10.1109/iccke50421.2020.9303669
|View full text |Cite
|
Sign up to set email alerts
|

A Concurrent BIST Architecture for Combinational Logic Circuits

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(1 citation statement)
references
References 21 publications
0
1
0
Order By: Relevance
“…To indicate the start and finish operation of a test sequence, the commence and end flags are utilized in the BIST. The number of faults discovered is analogised with the total possible defects count of the system (fault coverage) and the effectiveness of a BIST test is defined by test time [14][15][16].…”
Section: Introductionmentioning
confidence: 99%
“…To indicate the start and finish operation of a test sequence, the commence and end flags are utilized in the BIST. The number of faults discovered is analogised with the total possible defects count of the system (fault coverage) and the effectiveness of a BIST test is defined by test time [14][15][16].…”
Section: Introductionmentioning
confidence: 99%