2021
DOI: 10.1039/d0ja00289e
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A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis

Abstract: The study demonstrates a new method to quantify Secondary Ion Mass Spectrometry (SIMS) images by using a synergetic combination of Energy Dispersive X-ray spectroscopy (EDX) and SIMS.

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Cited by 8 publications
(6 citation statements)
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“…Using the propolis is detected in EDX results through the values of an organic element C in the prepared samples. The surface morphology and existing elements on the prepared samples are illustrated in Figure 8 [43, 44]. The (Si:Al) ratio of the zeolite‐mordenite sodium sample is 5.5 as reported by Schlenker et al [31], but the prepared samples are higher than that value.…”
Section: Resultsmentioning
confidence: 80%
“…Using the propolis is detected in EDX results through the values of an organic element C in the prepared samples. The surface morphology and existing elements on the prepared samples are illustrated in Figure 8 [43, 44]. The (Si:Al) ratio of the zeolite‐mordenite sodium sample is 5.5 as reported by Schlenker et al [31], but the prepared samples are higher than that value.…”
Section: Resultsmentioning
confidence: 80%
“…As it can be seen, the real metal content in the samples was lower than the nominal content (10 mM HAuCl 3 ) indicating a partial reduction of the metal precursor during the photochemical deposition process carried out under the experimental conditions of this work (Senthilkumar et al 2017). However, it is well known that EDX cannot detect elements with a lower atomic number, such as nitrogen (Z = 7) (Yedra et al 2021). The average values of the EDX shown in Table 1 indicate the deposition of gold nanoparticles on TiO 2 nanoparticles.…”
Section: Physicochemical Characterization Of the Au Np/tio 2 Nps-n 2 ...mentioning
confidence: 99%
“…The most common technique is the tracer method, which tracks the spatial distribution of isotopic elements at different times under the isothermal condition with different techniques, including secondary ion mass spectrometry (SIMS). Using nuclear magnetic resonance (NMR) or quasi-elastic neutron scattering (QENS) makes it possible to analyze atomic diffusion in crystalline materials and in battery research. Diffusion coefficients of atomic diffusion have also been measured by low-angle X-ray diffraction (XRD) (X-ray reflectometry, XRR) in solids, , XRD, , energy-dispersive X-ray spectroscopy, ,, and low-angle neutron diffraction (neutron reflectometry, NR). Most studies reported in the literature have been based on the isothermal condition, which require multiple measurements at different temperatures in order to determine the activation energy for atomic diffusion in solids. For example, Mizoguchi and Murata conducted low-angle XRD (XRR) analysis of compositionally modulated amorphous Co–Zr films isothermally annealed consecutively at different temperatures in a range of 120–180 °C and calculated the activation energy for the interdiffusion in the modulated amorphous Co–Zr films from the variation of the intensity of the X-ray peak.…”
Section: Introductionmentioning
confidence: 99%
“… 11 20 Using nuclear magnetic resonance (NMR) 21 24 or quasi-elastic neutron scattering (QENS) 25 27 makes it possible to analyze atomic diffusion in crystalline materials and in battery research. Diffusion coefficients of atomic diffusion have also been measured by low-angle X-ray diffraction (XRD) (X-ray reflectometry, XRR) in solids, 28 , 29 XRD, 30 , 31 energy-dispersive X-ray spectroscopy, 28 , 32 , 33 and low-angle neutron diffraction (neutron reflectometry, NR). 34 54 Most studies reported in the literature have been based on the isothermal condition, which require multiple measurements at different temperatures in order to determine the activation energy for atomic diffusion in solids.…”
Section: Introductionmentioning
confidence: 99%