Ageing of Integrated Circuits 2019
DOI: 10.1007/978-3-030-23781-3_8
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A Cost-Efficient Aging Sensor Based on Multiple Paths Delay Fault Monitoring

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Cited by 2 publications
(2 citation statements)
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“…Ebrahimi et al discovered the importance of lifetime reliability at the transistor level [32]. The importance of lifetime reliability was supported by G. Sai et al, who found that aging sensor detection is caused by multiple path delays generated at the transistor level [33]. The Eldo simulator tool was used in this work to predict the lifetime reliability in a 23-stage ring oscillator [34][35][36].…”
Section: Lifetime Reliability At the Transistor Levelmentioning
confidence: 83%
“…Ebrahimi et al discovered the importance of lifetime reliability at the transistor level [32]. The importance of lifetime reliability was supported by G. Sai et al, who found that aging sensor detection is caused by multiple path delays generated at the transistor level [33]. The Eldo simulator tool was used in this work to predict the lifetime reliability in a 23-stage ring oscillator [34][35][36].…”
Section: Lifetime Reliability At the Transistor Levelmentioning
confidence: 83%
“…Understanding these requirements is critical to keeping these systems secure and avoiding conflict when considering security for both the IT and the OT domains. Performance [117] • Depending on the application, the operation time delay and occasional failures can be acceptable.…”
Section: It Vs Ics Scenarios and Requirementsmentioning
confidence: 99%