A CPW linear resonator method for the microwave characterization of high dielectric constant films

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optical spectra of the uplink optical signals before and after modulation are shown in Figures 2(d) and 2(e), respectively. After transmitted over 50 km SMF, the upstream data are retrieved by using a 10-Gb/s optical receiver. EXPERIMENTAL RESULTSThe received constellation of the downstream OFDM signals before and after transmission over 50 km SMF and the corresponding bit error rate (BER) performance are shown in Figure 3. The performance of received constellation of the downstream OFDM signal has shown a little distortion because of the optical signal-noise-ratio (OSNR) degradation, whereas the OFDM signal before transmission at BER 10 À4 is À17.9 dBm and after is À17.3 dBm at the condition of 10 5 test points. The power penalty of downstream signals is smaller than 1 dB. Figure 4 illustrates the eye diagrams of the demodulated 2.5-Gb/s NRZ upstream data and the BER performance before and after transmission over 50 km SMF, we can see that clearly opened eye diagrams are obtained. The power penalty is about 1 dB. CONCLUSIONSWe have proposed and experimentally demonstrated a fullduplex OFDM-ROF system based on the mm-wave generated by an PM. We experimentally realized wavelength reusing of downstream wavelength without the erasure of downstream OFDM signals for uplink. The power penalty for downstream OFDM signals is smaller than 1 dB and the power penalty for OOK upstream signals is about 1 dB. ACKNOWLEDGMENTS

Section: Structure Descriptionsupporting

confidence: 79%

Experimental characterization of a planar transmission‐line transformer in multilayered high dielectric constant film structure

Demenicis

Conrado

Margulis³

et al. 2010

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“…The height and width of the substrate are, respectively H = 635 μm and A = 5.0 mm. The conventional cross‐section of the resonators used in previous simulations of this method [18, 19] is shown in Figure 1(a). However, it cannot be applied when RF sputtered thin films are considered because the film layer follows the conductor contour.…”

Section: Structure Descriptionmentioning

confidence: 99%

“…The technique is based on the resonance properties of the resonator [18, 19]. Comparison between measured results and theoretical predictions of transmission characteristics with frequency yields the determination of the dielectric properties of the film.…”

Section: Structure Descriptionmentioning

confidence: 99%

“…Recently [18], a CPW linear resonator technique for the experimental characterization of the dielectric constant and losses of thick films has been proposed and successfully used in the microwave frequency range. The approach is relatively easy to implement and consists of a film with unknown high dielectric constant deposited over the resonator printed on standard alumina substrate using conventional photolithography process.…”

Section: Introductionmentioning

confidence: 99%

“…This CPW linear resonator technique was previously used to extract microwave dielectric properties at room temperature of screen printed thick films of BTO, CaCu 3 T 4 O 12 (CCTO), and (BTO) x –(CCTO) 1− x composite with different concentrations and thickness between 100 and 120 μm at frequencies in the range of 50 MHz–20 GHz. The same technique was successfully applied to measure the dielectric constant and losses of CaTiO 3 (CTO), MgTiO 3 (MTO), and (MTO) x –(CTO) 1− x composite with x = 0.20, 0.5 and 0.95, and 100–170 μm thickness at microwave frequencies [18, 19].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Characterization of SrTiO₃ thin films at microwave frequencies using coplanar waveguide linear resonator method

Marulanda

Cremona

Santos

et al. 2011

and hybrid Raman/EDFA. It was demonstrated by simulation that the hybrid solution provides an equalized gain over a bandwidth of 50 nm.An analysis of a Raman amplification solution for C þ L band is also presented for normal and resilient operation. The net gain and OSNR demonstrate the feasibility of this solution for normal operation scenario but the resilient operation scenario is affected by a high gain ripple and Kerr nonlinear effects due to the high power achieved are very penalizing.An experimental assessment of the impact of the amplification scheme on the performance of an IP 10 Gibagit Ethernet system was also accomplished, demonstrating that the hybrid scheme is more suitable for the analyzed network.

Dielectric properties characterization of high dielectric constant thick films

Demenicis

Marulanda

Lima

et al. 2010

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A technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposited over the lines.Besides the simplicity, the technique allows the characterization of the films under similar conditions to those in which they will operate as compact devices in multilayered configurations. Time domain analysis and experimental results for 61‐micron thick Barium Titanate films have confirmed the relative dielectric constant and loss tangent values (respectively, 100 and 0.3) predicted by the frequency domain characterization proposed. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52:2339–2344, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25440