An inductively coupled plasma (ICP) is widely used for trace element analysis as an appropriate excitation source and an ionization one for optical emission spectrometry (ICP-OES) 1 and mass spectrometry (ICP-MS), 2,3 respectively. Although innovative efforts have been conducted to achieve further improvements in analytical sensitivity for both ICP-OES and ICP-MS, no reports have been found for axially viewing ICP-OES. In the 1980's, many examinations were performed on ICP-OES to improve the analytical sensitivities of elements. Mixed-gas ICPs such as Ar-N2 ICP, Ar-O2 ICP and Ar-H2 ICP, molecular-gas ICPs such as N2 ICP and O2 ICP, and He ICP were also examined to improve the analytical sensitivity of elements for OES analysis instead of Ar ICP-OES. 1,4 These ICPs sometimes showed better analytical performances compared with Ar ICP-OES; however, they have not been applied to commercial ICP-OES instruments because of some difficulties and complexities concerning the plasma operating conditions and optimization with respect to OES analysis. 1,4-6 It should also be remarked that these reported ICPs were examined only in radially viewing ICP-OES. 1,[4][5][6] In the present study, we found an effective sensitivity enhancement of elements in axially viewing ICP-OES by adding N2 gas into the Ar plasma gas. This is the first report concerning an examination of a mixed-gas ICP in axially viewing ICP-OES. In previous studies examined in radially viewing ICP-OES, 4-6 a shrunk plasma was obtained when N2 gas was added to Ar ICP. A shrunk plasma is considered to enhance the plasma-sample interaction; therefore, a sensitivity enhancement of elements can be obtained. In the present study, N2 gas was only added at flow rates of up to 1.0 L min -1 into 15 L min -1 of Ar plasma gas in a commercially available ICP-OES instrument; a sensitivity enhancement was then obtained. Except for a modification of the gas line for the addition of N2 gas into Ar plasma gas, no modifications were made to the ICP-OES instrument. The torch geometry was not changed, and optimization of the spectrometer was not performed for Ar-N2 ICP, but for Ar ICP. It is concluded that the developed Ar-N2 ICP technique used in the present study is simple, useful and effective as an advanced analytical technique in axially viewing ICP-OES.
Experimental
InstrumentationThe ICP-OES instrument used was an Optima 4300 DV (PerkinElmer, USA). Though the instrument can be used for both axially viewing ICP-OES and radially viewing one, the former was used. Table 1 gives the operating conditions for the ICP-OES instrument. Except for the plasma gas flow rate of N2, all parameters were fixed during all experiments in the present study. The ICP torch used was a Fassel-type long one, which is usually supplied with the ICP-OES instrument. The ICP-OES instrument was designed for Ar ICP-OES, that is, the spectrometer was optimized with respect to the Ar ICP. In the present study, except for a gas line of N2 added to the Ar plasma gas, no modifications were performed on the ICP-O...