2019
DOI: 10.1109/tase.2018.2878063
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A Cyclic Scheduling Approach to Single-Arm Cluster Tools With Multiple Wafer Types and Residency Time Constraints

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Cited by 32 publications
(15 citation statements)
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“…This is a prominent constraint in wafer production. Wang et al [5] studied the scheduling problem of multi-wafer types in cluster tools with residency time constraints. They developed multiplex backward sequence strategy and virtual module technology to optimize the research problem.…”
Section: Literature Reviewmentioning
confidence: 99%
“…This is a prominent constraint in wafer production. Wang et al [5] studied the scheduling problem of multi-wafer types in cluster tools with residency time constraints. They developed multiplex backward sequence strategy and virtual module technology to optimize the research problem.…”
Section: Literature Reviewmentioning
confidence: 99%
“…If R > m i (10) x g+h×n i = 1; (11) R = max(R−1, 0); (12) For f = 1 to q (13) If (g + h×n i − f )/q is a non-negative integer (14) x f = 1; (15) x f = x f ; (16) Perform one of Algorithms 1 and 2 for Step s; (17) If…”
Section: Formentioning
confidence: 99%
“…By co time variation, an adaptive scheduling method is presented for clu delay constraints in [11]. With WRTCs and multiple wafer types bein scheduling approaches are proposed for SACTs in [12] and DACTs For process-bound cluster tools, robot tasks take much less tim wafer in a PM such that the system cycle time is determined by the pleting a wafer at the bottleneck step. Hence, in a cycle, the robot has treated as robot waiting time.…”
Section: Introductionmentioning
confidence: 99%
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“…Over the past decades, researchers conducted extensive prominent studies with respect to scheduling cluster tools under diverse instances, including wafer residency time constraints (WRTCs) [10]- [15], activity time variation [16]- [20], wafer revisiting processes [21]- [27], PM failures [28], [29], chamber cleaning operation [1], [30]- [32], and multi-cluster tools [33]- [42], which are thoroughly reviewed in [43]. Moreover, the latest advancements can be found in [44], [45]. Note that all the aforementioned works are dedicated to the scheduling and control problems of single-wafer-type fabrication.…”
mentioning
confidence: 99%