Asian Society for Precision Engineering and Nanotechnology (ASPEN 2022) 2022
DOI: 10.3850/978-981-18-6021-8_or-11-0124.html
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A Cylindricity Measurement with Nanometric Uncertainty

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“…Thus, an overview of all accessible defects considering a particular AM process, is an essential tool to clarify the designer's choice and to widen its interaction with the manufacturer and the metrologist. More precisely, an efficient design methodology can only be reached with the constant interaction performed between the designer, the manufacturer and the metrologist [18,19]. This communication allows to conciliate all design requirements, manufacturing and measuring constraints, leading to a customised, printable and measurable AM product [20].…”
Section: Introductionmentioning
confidence: 99%
“…Thus, an overview of all accessible defects considering a particular AM process, is an essential tool to clarify the designer's choice and to widen its interaction with the manufacturer and the metrologist. More precisely, an efficient design methodology can only be reached with the constant interaction performed between the designer, the manufacturer and the metrologist [18,19]. This communication allows to conciliate all design requirements, manufacturing and measuring constraints, leading to a customised, printable and measurable AM product [20].…”
Section: Introductionmentioning
confidence: 99%