2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) 2017
DOI: 10.1109/etfa.2017.8247659
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A data-driven prognostics framework for tool remaining useful life estimation in tool condition monitoring

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Cited by 17 publications
(14 citation statements)
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“…The imbalance ratio (IR) of this dataset is 10. The data preprocessing and time window process are the same with [5].…”
Section: B Experimental Setupmentioning
confidence: 99%
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“…The imbalance ratio (IR) of this dataset is 10. The data preprocessing and time window process are the same with [5].…”
Section: B Experimental Setupmentioning
confidence: 99%
“…C LASS imbalance with disproportionate number of class instances commonly affects the quality of learning algorithms. Multifarious imbalanced data problems exist in numerous real-world applications, such as fault diagnosis [1], recommendation systems, fraud detection [2], risk management [3], tool condition monitoring [4], [5], [6] and medical diagnosis [7], brain computer interface (BCI) [8], [9], data visualization [10], etc. As a result of the equal misclassification costs or balanced class distribution assumption, the traditional learning algorithms are prone to the majority class when dealing with complicated classification problems that have skewed class distribution.…”
Section: Introductionmentioning
confidence: 99%
“…However, the aging mechanism of real device systems is usually non-linear, randomized and dynamic, which causes difficulty to obtain accurate results by an analytical model [5]. The data-driven approach is designed to transform the device's detection and operational data into the degradation information of the device, which reveals the system operational status and corresponding degradation mechanism model [6]. Such methods exploit Artificial Intelligence (AI) and statistical methods to learn the degradation patterns of devices and predict the remaining useful life (RUL) of the device [7].…”
Section: Introductionmentioning
confidence: 99%
“…However, the aging mechanism of real device systems is usually non-linear, randomized and dynamic, which causes difficulty to obtain accurate results by an analytical model. [6] The data-driven approach is designed to transform the device's detection and operational data into the degradation information of device, which reveals the system operational status and corresponding degradation mechanism model [7]. Such methods exploit Artificial Intelligence (AI) and statistical methods to learn the degradation patterns of devices, and predict the Remaining Useful Life (RUL) of the device [8].…”
Section: Introductionmentioning
confidence: 99%