2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) 2016
DOI: 10.1109/icecs.2016.7841277
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A data extraction and debugging framework for large-scale MPSoCs

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Cited by 2 publications
(3 citation statements)
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“…Increasing the number of the many-core components, low-level debugging with waveforms and logs becomes unfeasible. Memphis supports the integration of simulators with an intuitive debugging framework [23], composed by a Data Extraction Layer (DEL) and a set of graphical tools, enabling developers to trace high-level system events during simulation.…”
Section: Memphis Logical Design Flowmentioning
confidence: 99%
See 1 more Smart Citation
“…Increasing the number of the many-core components, low-level debugging with waveforms and logs becomes unfeasible. Memphis supports the integration of simulators with an intuitive debugging framework [23], composed by a Data Extraction Layer (DEL) and a set of graphical tools, enabling developers to trace high-level system events during simulation.…”
Section: Memphis Logical Design Flowmentioning
confidence: 99%
“…Increasing the number of the many-core components, low-level debugging with waveforms and logs becomes unfeasible. Memphis supports the integration of simulators with an intuitive debugging framework[23], composed by a Data Extraction Layer (DEL) and a set of graphical tools, enabling developers to trace high-level system events during simulation.The many-core description receives a module named Data Extraction Layer (DEL) responsible for capturing communication and computation events. It is important to mention that the DEL is non-intrusive, i.e., it only captures data, storing them in a database and not affecting the applications' performance.…”
mentioning
confidence: 99%
“…Increasing the number of the many-core components, low-level debugging with waveform and logs becomes unfeasible. The framework supports the integration of simulators with an intuitive debugging framework [12], with a set of graphical tools enabling developers to trace high-level system events during simulation.…”
Section: Dynamic Application Injection Protocolmentioning
confidence: 99%