2021
DOI: 10.1016/j.psep.2021.08.022
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A deep learning model for process fault prognosis

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Cited by 111 publications
(24 citation statements)
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“…The dependence of processes on engineered devices also gives rise to concerns about their safety and integrity (Khan et al, 2021). Emergent technologies play an important role in increasing process safety (Ahmed, 2021;Sajid et al, 2021), for example, through DT-assisted process fault prognosis (Arunthavanathan et al, 2021;Adumene et al, 2021). From a lifecycle perspective, BPM includes activities, such as process identification, discovery, analysis, implementation, execution, monitoring, controlling and improvement (Recker and Mendling, 2016;Kerpedzhiev et al, 2020).…”
Section: Business Process Management and Improvementmentioning
confidence: 99%
See 1 more Smart Citation
“…The dependence of processes on engineered devices also gives rise to concerns about their safety and integrity (Khan et al, 2021). Emergent technologies play an important role in increasing process safety (Ahmed, 2021;Sajid et al, 2021), for example, through DT-assisted process fault prognosis (Arunthavanathan et al, 2021;Adumene et al, 2021). From a lifecycle perspective, BPM includes activities, such as process identification, discovery, analysis, implementation, execution, monitoring, controlling and improvement (Recker and Mendling, 2016;Kerpedzhiev et al, 2020).…”
Section: Business Process Management and Improvementmentioning
confidence: 99%
“…Emergent technologies play an important role in increasing process safety (Ahmed, 2021; Sajid et al. , 2021), for example, through DT-assisted process fault prognosis (Arunthavanathan et al. , 2021; Adumene et al.…”
Section: Introductionmentioning
confidence: 99%
“…Further, to eliminate suspected outliers from the training data, the concept of automatic adjustment in tuning parameters is proposed iteratively, using a bisection algorithm . Arunthavanathan et al proposed the method to reduce the impact of the noise based on the anomaly margin in the training data frame using one-class SVM …”
Section: Introductionmentioning
confidence: 99%
“…18 Arunthavanathan et al proposed the method to reduce the impact of the noise based on the anomaly margin in the training data frame using one-class SVM. 23 An incremental one-class SVM was initially proposed based on the batch algorithm to detect multiple deviation points. 19 An incremental one-class approach was developed using the learning by the model algorithm.…”
Section: Introductionmentioning
confidence: 99%
“…Zhang et al design a fault detection index based on log conditional probability of the CRF. 33 Arunthavanathan et al 34 utilize convolution neural network and long short-term memory for fault sequence learning.…”
Section: Introductionmentioning
confidence: 99%