A series of density functional theory calculations were
performed
to understand the bonding and interaction of hydrogen adsorption on
two-dimensional silicon carbide obtained from molecular dynamics simulation.
The converged energy results pointed out that the H atom can sufficiently
bond to 2D SiC at the top sites (atop Si and C), of which the most
stable adsorption site is TSi. The vibrational properties
along with the zero-point energy were incorporated into the energy
calculations to further understand the phonon effect of the adsorbed
H. Most of the 2D SiC structure deformations caused by the H atoms
were found at the adsorbent atom along the vertical axis. For the
first time, five SiC defect formations, including the quadrilateral-octagon
linear defect (8-4), the silicon interstitial defect, the divacancy
(4-10-4) defect, the divacancy (8-4-4-8) defect, and the divacancy
(4-8-8-4) defect, were investigated and compared with previous 2D
defect studies. The linear defect (8-4) has the lowest formation energy
and is most likely to be formed for SiC materials. Furthermore, hydrogen
atoms adsorb more readily on the defect surface than on the pristine
SiC surface.