A digital system for surface roughness analysis of plane and cylindrical parts

Chiffre, Leonardo De; Nielsen, Henrik S.

doi:10.1016/0141-6359(87)90054-7

Cited by 18 publications

(6 citation statements)

References 5 publications

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“…Both systems were essentially based on making measurement along parallel traces using conventional stylus systems. However, the progress in surface texture measurement was slow until the advent of the new generation of personal computers in the 1980s, making areal measurements more practical in terms of handling the large amount of data involved (Teague et al 1982;De Chiffre & Nielsen 1987).…”

Section: Current Shift: Profile To Areal Characterization (A ) Classimentioning

confidence: 99%

Paradigm shifts in surface metrology. Part II. The current shift

et al. 2007

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This is the second part of the paper 'Paradigm shifts in surface metrology'. In part I, the three historical paradigm shifts in surface metrology were brought together, and the subsequent evolution resulting from the shifts discussed. The historical philosophy highlighted the fact that the paradigm shifts must be robust and flexible, meaning that surface metrology must allow for full control of surface manufacture and provide an understanding of the surface functional performance. Part II presents the current paradigm shift as a 'stepping stone', building on the above historical context. Aspects of surface geometry will also have to cater for surfaces derived from disruptive application, i.e. structured and freeform surfaces are identified candidates. The current shift is presented in three aspects: from profile to areal characterization; from stochastic to structured surfaces; and from simple geometries to complex freeform geometries, all spanning the millimetre to sub-nanometre scales. In this paradigm shift, the scale of surface texture is beginning to approach some of the geometrical features in micro/nano electro-mechanical systems devices and is becoming one of the most important functionality indicators. Part II will contextualize the current shifts in the discipline of surface metrology, and cement surface metrology in place in the ultra precision and nanotechnology age.

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Section: Current Shift: Profile To Areal Characterization (A ) Classimentioning

confidence: 99%

Paradigm shifts in surface metrology. Part II. The current shift

et al. 2007

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“…It also controls both horizontal and rotary scanning of the object and records the object output in the form of the reflected light intensity or height of the object point. The system can be used in planar, axial and tangential tracing strategies [8] to measure both the two-and the threedimensional surface topography of planar and cylindrical parts.…”

Section: A Description Of the Systemmentioning

confidence: 99%

“…Functional characterization was carried out for some industrial applications [6]. Several researchers have also been working on characterization on surfaces in three-dimensions using various instruments and techniques [7][8][9]. The measurement of form errors of cylindrical surfaces and development of parameters for characterizing surfaces were not studied in the abovementioned work.…”

Section: Introductionmentioning

confidence: 99%

Characterization of surface topography by confocal microscopy: I. Principles and the measurement system

Udupa

Singaperumal

Sirohi

et al. 2000

Meas. Sci. Technol.

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Surface topography and, in particular, roughness and form, plays an important role in determining the functional performance of engineering parts. The measurement and understanding of surface topography is rapidly attracting the attention of the physicist, the biologist and the chemist as well as the engineer. Optics in general played an important role in measurement and, with the advent of opto-mechatronics, it is once again at the forefront of measurement. In this paper, the principles and performance of a confocal microscope, together with the measurement system, are described. Suitable fixtures are developed and integrated with the computer system for generating three-dimensional surface and form data. Software for data acquisition, analysis of various parameters including new parameters and visualization of surface geometrical features has been developed. Both the intensity and the auto-focus methods are used to measure two-dimensional surface roughness by use of the system and results are presented. The measurement and characterization of three-dimensional surface topography and form error will be presented in part II of this paper.

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“…The development of instruments measuring surface texture traces back to the early 30s, when Schmalz [1] and Abbot and Firestone [2] introduced the first stylus instruments which, following the principle of a gramophone [3], could scan over a surface picking up information from a workpiece. A transducer establishes the small height differences between the probed information and a reference part and converts them into an electrical signal which is digitalized and sent to a computer for further processing and analyses [4][5][6]. Together with the technological improvements and the world-wide spread of such instrumentation, the methods and especially the parameters for describing surface measurements soon began to proliferate and only in the middle of the 90s were the filtering methods and the surface parameters eventually standardized by ISO [7][8][9][10][11].…”

Section: Introductionmentioning

confidence: 99%

A new procedure for characterizing textured surfaces with a deterministic pattern of valley features

Godi

Kühle

Chiffre

2013

Meas. Sci. Technol.

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In recent years there has been the development of a high number of manufacturing methods for creating textured surfaces which often present deterministic patterns of valley features. Unfortunately, suitable methodologies for characterizing them are lacking. Existing standards cannot in fact properly characterize such surfaces, providing at times unreasonable values. In this paper, a new procedure for characterizing such surfaces is proposed, relying on advanced filtering and feature recognition and separation. Existing advanced filtering methods do not always eliminate all distortions, therefore some modifications are investigated. In particular the robust Gaussian regression filter has been modified providing an envelope first-guess in order to always fit the mean line through the plateau region. Starting from a filtered and aligned profile, the feature thresholds recognition and separation is therefore made possible. In particular the plateau and valley regions can be detected, separated and independently analyzed according to their function. The example of a multifunctional profile is presented. The profile is analyzed using the new procedure, which demonstrates outputting a correctly aligned roughness profile and permitting comprehensive feature analyses.

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A digital system for surface roughness analysis of plane and cylindrical parts

Cited by 18 publications

References 5 publications

Paradigm shifts in surface metrology. Part II. The current shift

Paradigm shifts in surface metrology. Part II. The current shift

Characterization of surface topography by confocal microscopy: I. Principles and the measurement system

A new procedure for characterizing textured surfaces with a deterministic pattern of valley features

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