A diodelike conduction model for the postbreakdown current in metal–oxide–semiconductor structures

Miranda, E.

doi:10.1063/1.1812584

Cited by 18 publications

(5 citation statements)

References 20 publications

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“…Electroforming and soft-breakdown can occur in layers, where materials can become bistable e.g. oxides [17,[28][29][30]. Also LiF/Polymer interfaces can become electrically bistable [15].…”

Section: Discussionmentioning

confidence: 99%

Low-frequency noise as a diagnostic tool for OLED reliability

Rocha

Gomes

Vandamme

et al. 2013

2013 22nd International Conference on Noise and Fluctuations (ICNF)

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Organic light emitting diodes (OLED), either based on polymers or small molecules, suffer from early failure: an unpredictable sudden increase in current with a total loss of light output. This work addresses this problem using small-signal impedance measurements and electrical noise techniques. Robust OLEDs show a current noise spectrum proportional to 1/f. OLEDs susceptible to failure have 1/f 3/2 and/or may start exhibiting a standard 1/f behavior that rapidly evolves with time (typical 30 minutes) to 1/f 1.6 . In addition OLEDs susceptible to early failure have a higher DC leakage. It is proposed that a combination of both measurements can be used as a diagnostic tool for OLED reliability in a production line.Insight into the physics of the degradation mechanism is also provided. Unreliable OLEDs exhibit current switching events and optical blinks at wavelengths higher than the polymer band gap electroluminescence. It is proposed that degradation is induced by the appearance of an insulating resistive switching layer. Charge recombination trough this layer is responsible for the optical and electrical blinks. Keywords-OLED reliability, diagnostic tool, low frequency noise and impedance spectroscopyI.

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“…Electroforming and soft-breakdown can occur in layers, where materials can become bistable e.g. oxides [17,[28][29][30]. Also LiF/Polymer interfaces can become electrically bistable [15].…”

Section: Discussionmentioning

confidence: 99%

Low-frequency noise as a diagnostic tool for OLED reliability

Rocha

Gomes

Vandamme

et al. 2013

2013 22nd International Conference on Noise and Fluctuations (ICNF)

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“…may all be modeled in this fashion. Exponential diode-like models with series resistance have also been used to characterize the postbreakdown behavior of metal-oxidesemiconductor structures (6).…”

Section: Introductionmentioning

confidence: 99%

Parameter Extraction in Quadratic Exponential Junction Model with Series Resistance using Global Lateral Fitting

Lugo-Muñoz

Souza

Pavanello³

et al. 2010

ECS Trans.

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A global lateral fitting procedure is proposed to extract the parameters of quadratic double exponential junction models in the presence of parasitic series resistance. Error analysis of the extracted parameters values within a large representative family of synthetic data indicate excellent match between the extracted values and a wide range of the original given model parameters. The procedure was also tested on real data to extract the model parameters of an experimental Silicon PIN diode measured at cryogenic temperature.

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“…4 Research has focused mainly on the pre-DB mechanism. 5,6 The post-DB conduction mechanisms 7,8 have received comparatively little attention. However, it has long been known that if excessive Joule heating is prevented, DB leads initially to bistable currentvoltage characteristics rather than directly to device failure.…”

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confidence: 99%

Reversible post-breakdown conduction in aluminum oxide-polymer capacitors

Chen

Gomes

Rocha

et al. 2013

Applied Physics Letters

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Aluminum/Al2O3/polymer/metal capacitors submitted to a low-power constant current stress undergo dielectric breakdown. The post-breakdown conduction is metastable, and over time the capacitors recover their original insulating properties. The decay of the conduction with time follows a power law (1/t)α. The magnitude of the exponent α can be raised by application of an electric field and lowered to practically zero by optical excitation of the polyspirofluorene polymer. The metastable conduction is attributed to formation of metastable pairs of oppositely charged defects across the oxide-polymer interface, and the self-healing is related to resistive switching.

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A diodelike conduction model for the postbreakdown current in metal–oxide–semiconductor structures

Cited by 18 publications

References 20 publications

Low-frequency noise as a diagnostic tool for OLED reliability

Low-frequency noise as a diagnostic tool for OLED reliability

Parameter Extraction in Quadratic Exponential Junction Model with Series Resistance using Global Lateral Fitting

Reversible post-breakdown conduction in aluminum oxide-polymer capacitors

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