A Direct Method for the Determination of Orientation Relationships Using TEM

Abstract

A new method for the determination of orientation relationships has been developed. The method is based on a recently proposed direct method for orientation determination using a transmission electron microscope (TEM). The determination of the orientation relationship can be done by two different but generally applicable approaches. The first approach is especially applicable for crystals with orthogonal base vectors, the second approach is especially applicable for crystals with non-orthogonal base vectors and the general bicrystal.

Towards 3D image-based nanocrystallography by means of transmission electron goniometry

“…P. Moeck's method [2], on the other hand, constitutes goniometry of direct lattice vectors and has so far been mainly used in connection with series of Kikuchi-pole patterns for direct crystallographic analyses, e.g. crystal orientation determinations [5], orientation relationship determinations [6], grain-and phase boundary parameter determinations [7], and texture estimations [8]. Using a similar matrix approach, W. Prantl concurrently developed computer programs for crystallographic analyses on the basis of spot diffraction patterns [9,10].…”

“…Also working with spot diffraction patterns, C.T. The accuracy that can be achieved from spot diffraction pattern data is, however, by far inferior to that which is obtainable from high resolution images [1,12,13] and Kikuchi poles [5][6][7][8]. The accuracy that can be achieved from spot diffraction pattern data is, however, by far inferior to that which is obtainable from high resolution images [1,12,13] and Kikuchi poles [5][6][7][8].…”

“…This is demonstrated by the relative large differences in Chou's experimental and calculated goniometer settings [11]. Transmission electron goniometry is a neologism that seems appropriately general to describe these methods [1][2][3][4][5][6][7][8][9][10][11][12][13] and combinations of the two approaches to image-based nanocrystallography in TEM [1,2]. Transmission electron goniometry is a neologism that seems appropriately general to describe these methods [1][2][3][4][5][6][7][8][9][10][11][12][13] and combinations of the two approaches to image-based nanocrystallography in TEM [1,2].…”

“…a goniometer, is employed to derive the coordinates of reciprocal [1,3,4,[9][10][11][12][13] and/or direct [2,[5][6][7][8] lattice vectors in a Cartesian coordinate system that is fixed to the TEM. It means in the context of this paper that a calibrated TEM specimen holder, i.e.…”

“…Java-based applets by one of the authors of this paper that simulate a tiltrotation TEM goniometer [24] and a double-tilt TEM goniometer [25] are accessible freely over the internet. Transmission electron goniometry can, thus, be practiced with calibrated two-axis TEM specimen holders of the current designs [1][2][3][4][5][6][7][8][9][10][11][12][13]. Transmission electron goniometry can, thus, be practiced with calibrated two-axis TEM specimen holders of the current designs [1][2][3][4][5][6][7][8][9][10][11][12][13].…”