A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits

Abstract

With the continuous progress in integrated circuit technology, single-event effect (SEE) has become a key factor affecting the reliability of aerospace integrated circuits. Simulating fault injection using the computer simulation technique effectively reflects the SEE in aerospace integrated circuits. Due to various masking effects, only a small number of faults will result in errors; the traditional method of injecting one fault in one workload execution is inefficient. The method of injecting multiple faults in one workload execution will make it impossible to judge which fault results in errors because the propagation characteristic of SEE and faults may affect each other. This paper proposes an improved multi-point fault injection method to improve simulation efficiency and solve the problems of the general multi-point fault injection method. If one workload execution does not result in errors, multiple faults can be verified by one workload execution. If one workload execution results in errors, a specific grouping method can be used to determine which faults result in errors. The experimental results show that the proposed method achieves a good acceleration effect and significantly improves the simulation efficiency.

Enhancement of Deep Neural Network Recognition on MPSoC with Single Event Upset

“…However, these MPSoCs, which are manufactured with scaled technology, such as the 16nm FinFET technology, are susceptible to single event upsets (SEUs) in irradiative environments. It is widely recognized that SEUs can cause data errors or device malfunctions, particularly in aerospace [21][22][23][24]. Furthermore, advanced electronic systems on the ground are also susceptible to SEUs and face potential threats from them [25].…”