A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship

Djordjević, S.; Pesic, M.T.

doi:10.1007/s10836-020-05901-5

Cited by 5 publications

(4 citation statements)

References 19 publications

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“…In such cases, the typical approach is to use SAT methods. The group of methods includes identification, verification, and optimization methods [17,27,32,[40][41][42]. SAT methods typically lead to a nonlinear test equation whose solution (or solutions) meets measurement readings.…”

Section: Introductionmentioning

confidence: 99%

Diagnosis of Analog Circuits: The Problem of Ambiguity of Test Equation Solutions

Hałgas

2024

Electronics

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Diagnosis of analog electronic circuits is a crucial issue in computer-aided design. During the diagnosis, solving a test equation to identify the values of faulty parameters is usually necessary. The equation is nonlinear to the parameters, even for linear circuits. The nonlinearity of the equation implies the possibility of multiple solutions. No method exists that guarantees the determination of all the solutions of the test equation. However, even information about more than one existing solution is essential for the designer. It allows for the selection of another test at the design step and helps to obtain an unambiguous solution during the diagnosis. Information about the possibility of additional solutions is essential for simulation after test methods (e.g., identification and verification methods) and for simulation before test methods, so-called dictionary methods, especially those targeting multiple fault classification. The paper deals with the problem of multiple solutions of the test equation for nonlinear DC circuits and proposes a method for identifying the solutions using a deflation technique. The outcomes are compared with the results obtained using standard and adaptively damped Newton–Raphson iterative methods. The methods use randomly selected initial guesses to find multiple solutions. The effectiveness of all the methods for identifying multiple solutions was verified numerically and via laboratory tests.

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Section: Introductionmentioning

confidence: 99%

Diagnosis of Analog Circuits: The Problem of Ambiguity of Test Equation Solutions

Hałgas

2024

Electronics

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“…Numerous works in this field are focused on the problem of single fault diagnosis [5]- [7], because this is the most frequent case [8]. The diagnostic methods and techniques are based on circuit theory and signal processing methods [9]- [11], various branches of mathematics [7], [12]- [15], and Artificial Intelligence (AI) concepts [16]- [22].…”

Section: Introductionmentioning

confidence: 99%

“…Faults that occur in analog circuits can be divided into parametric and catastrophic. Different approaches have been proposed for parametric fault diagnosis [9], [16], [17], [23], [24]. Short and open in circuit connectivity are classified as catastrophic faults.…”

Section: Introductionmentioning

confidence: 99%

A Method for Parametric and Catastrophic Fault Diagnosis of Analog Linear Circuits

Tadeusiewicz

Hałgas

2022

IEEE Access

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A universal method for single parametric and catastrophic fault diagnosis of analog linear circuits is presented in this paper. The methodology is based on fundamental laws governing linear circuits and methods of their analysis. The method involves creating models of the faulty elements, both passive and active, including current and voltage sources and applying an appropriately modified node method. This enables the creation of simple formulas to define the parameters of the faulty elements. Some measurement data must be collected during the course of the diagnostic test performed in the frequency domain and certain computation results obtained in the before-test-process. The method achieves all of the objectives of fault diagnosis: detection, location, and estimation of the faulty value. In 88.48%, the method correctly identifies the fault and estimates its value, but in 6.47%, the actual fault is accompanied by a virtual fault. The method is adapted to real conditions to improve the practical relevance and can be directly extended to double fault diagnosis. Six numerical examples are presented to illustrate the method.

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“…Important questions of the fault diagnosis are testability analysis and test point selection [5][6][7][8][9]. The parametric fault diagnosis problem has attracted a great deal of attention both in linear circuits [10][11][12][13] and nonlinear circuits [14][15][16][17]. Catastrophic fault diagnosis of bipolar and Complementary Metal Oxide Semiconductor (CMOS) circuits was considered in [18].…”

Section: Introductionmentioning

confidence: 99%

Parametric Fault Diagnosis of Very High-Frequency Circuits Containing Distributed Parameter Transmission Lines

Tadeusiewicz

Hałgas

2021

Electronics

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Parametric fault diagnosis of analog very high-frequency circuits consisting of a distributed parameter transmission line (DPTL) terminated at both ends by lumped one-ports is considered in this paper. The one-ports may include linear passive and active components. The DPTL is a uniform two-conductor line immersed in a homogenous medium, specified by the per-unit-length (p-u-l) parameters. The proposed method encompasses all aspects of parametric fault diagnosis: detection of the faulty area, location of the fault inside this area, and estimation of its value. It is assumed that only one fault can occur in the circuit. The diagnostic method is based on a measurement test arranged in the AC state. Different approaches are proposed depending on whether the faulty is DPTL or one of the one-ports. An iterative method is modified to solve various systems of nonlinear equations that arise in the course of the diagnostic process. The diagnostic method can be extended to a broader class of circuits containing several transmission lines. Three numerical examples reveal that the proposed diagnostic method is fast and gives quite accurate findings.

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A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship

Cited by 5 publications

References 19 publications

Diagnosis of Analog Circuits: The Problem of Ambiguity of Test Equation Solutions

Diagnosis of Analog Circuits: The Problem of Ambiguity of Test Equation Solutions

A Method for Parametric and Catastrophic Fault Diagnosis of Analog Linear Circuits

Parametric Fault Diagnosis of Very High-Frequency Circuits Containing Distributed Parameter Transmission Lines

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