A Feedfordward Adaptive Controller to Reduce the Imaging Time of Large-Sized Biological Samples with a SPM-Based Multiprobe Station

Otero, J. F. Fuentes; Guerrero, Hector; González, Laura López; Puig-Vidal, M.

doi:10.3390/s120100686

Cited by 4 publications

(3 citation statements)

References 30 publications

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“…In most cases, however, a high scan speed is desirable. A feedforward controller that controls the scan speed depending on the predicted sample topography was presented in [130]. If a region of the sample topography is predicted to be flat by the controller, then the scan speed would be set at a high rate.…”

Section: Reducing Scan Speedmentioning

confidence: 99%

Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping-Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging

Fairbairn

Moheimani

2013

IEEE Control Syst.

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T he atomic force microscope (AFM) [1] is a mechanical microscope capable of producing three-dimensional images of a wide variety of sample surfaces with nanometer precision in air, vacuum, or liquid environments. This article provides an overview of the AFM and its three main modes of operation, with a focus on the tapping mode of operation. The challenges associated with obtaining high-speed images with a tapping-mode AFM while minimizing image artifacts are outlined and control techniques that have been developed to overcome these challenges are reviewed.

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Section: Reducing Scan Speedmentioning

confidence: 99%

Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping-Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging

Fairbairn

Moheimani

2013

IEEE Control Syst.

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“…In most cases, however, a high scan speed is desirable. Otero et al [18] developed a feedforward controller which controls the scan speed depending on the predicted sample topography. If a region of the sample topography is predicted to be flat by the controller then the scan speed would be set at a high rate.…”

Section: A Reducing Scan Speedmentioning

confidence: 99%

A Switched Gain Resonant Controller to Minimize Image Artifacts in Intermittent Contact Mode Atomic Force Microscopy

Fairbairn

Moheimani

2012

IEEE Trans. Nanotechnology

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Abstract-As the scan speed of the atomic force microscope (AFM) operating in intermittent contact mode is increased, the likelihood of artifacts appearing in the image is increased due to the probe tip losing contact with the sample. This paper presents an analysis of the effects of probe loss and a new method, switched gain resonant control, of reducing the problem of probe loss when imaging at high speed. The switched gain resonant controller is implemented to switch the cantilever quality Q factor according to the sample profile during the scan. If the controller detects that the probe has lost contact with the sample the cantilever Q factor is increased leading to a faster response of the feedback controller, expediting the resumption of contact. A significant reduction in image artifacts due to probe loss is observed when this control technique is employed at high scan speeds.Index Terms-Atomic Force Microscopy, field-programmable analog array (FPAA), quality factor control, resonant control.

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“…Also, the tip is millimeters long, so sample access is much better than with standard cantilevers, and QTF experiments can be performed in Petri dishes, well-plates and other array-like sample preparations. Long tips and laser-free detection also facilitate the integration of more than one sensor in the measurement setup to conduct complex experiments with more than one probe [ 25 , 26 ]. Even the integration of QTF sensors in microanalysis systems and lab-on-a-chip devices could solve some of the problems related with mass detection using micromachined cantilevers.…”

Section: Introductionmentioning

confidence: 99%

Nanocharacterization of Soft Biological Samples in Shear Mode with Quartz Tuning Fork Probes

Otero

González

Puig-Vidal

2012

Sensors

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Quartz tuning forks are extremely good resonators and their use is growing in scanning probe microscopy. Nevertheless, only a few studies on soft biological samples have been reported using these probes. In this work, we present the methodology to develop and use these nanosensors to properly work with biological samples. The working principles, fabrication and experimental setup are presented. The results in the nanocharacterization of different samples in different ambients are presented by using different working modes: amplitude modulation with and without the use of a Phase-Locked Loop (PLL) and frequency modulation. Pseudomonas aeruginosa bacteria are imaged in nitrogen using amplitude modulation. Microcontact printed antibodies are imaged in buffer using amplitude modulation with a PLL. Finally, metastatic cells are imaged in air using frequency modulation.

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A Feedfordward Adaptive Controller to Reduce the Imaging Time of Large-Sized Biological Samples with a SPM-Based Multiprobe Station

Cited by 4 publications

References 30 publications

Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping-Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging

Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping-Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging

A Switched Gain Resonant Controller to Minimize Image Artifacts in Intermittent Contact Mode Atomic Force Microscopy

Nanocharacterization of Soft Biological Samples in Shear Mode with Quartz Tuning Fork Probes

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