2011
DOI: 10.1088/0960-1317/21/11/115025
|View full text |Cite
|
Sign up to set email alerts
|

A finite element technique for accurate determination of interfacial adhesion force in MEMS using electrostatic actuation

Abstract: This paper reports on accurate analysis of adhesion force between polysilicon–polysilicon surfaces in micro-/nanoelectromechanical systems (M/NEMS). The measurement is carried out using double-clamped beams. Electrostatic actuation and structural restoring force are exploited to respectively initiate and terminate the contact between the two surfaces under investigation. The adhesion force is obtained by balancing the electrostatic and mechanical forces acting on the beam just before the separation of the two … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 12 publications
(4 citation statements)
references
References 34 publications
(49 reference statements)
0
4
0
Order By: Relevance
“…It thus abstains from resolving the exact kinematics of adhesion and contact at the fiber scale and applies an effective energy gain per unit length of contacting parallel fiber segments and solves for the corresponding bundle segment lengths as additional unknowns. Finally, an example for the electrostatic interaction of a double-clamped microbeam with a flat rigid electrode in a microelectromechanical system is given in [16].…”
Section: Introductionmentioning
confidence: 99%
“…It thus abstains from resolving the exact kinematics of adhesion and contact at the fiber scale and applies an effective energy gain per unit length of contacting parallel fiber segments and solves for the corresponding bundle segment lengths as additional unknowns. Finally, an example for the electrostatic interaction of a double-clamped microbeam with a flat rigid electrode in a microelectromechanical system is given in [16].…”
Section: Introductionmentioning
confidence: 99%
“…Excessive adhesion force may also result in permanent stiction and catastrophic failure. The adhesion force depends on the material and surface properties and ambient conditions [27]- [31]. In this section, we show that the rigidelectrode NEM relay design can provide larger restoring force and control the pull-in/pull-out window by changing the source geometry.…”
Section: Adhesion Force and Pull-in/pull-out Hysteresismentioning
confidence: 98%
“…ANSYS coupled-field multiphysics solver was used to model the electrostatic and structural domains. This finite element solver has been demonstrated to precisely predict the pull-in voltage and electro-mechanical behavior of MEMS devices [27]. In this FEM model, the source, drain and gate are modeled in structural domain and the air surrounding them is meshed in electrostatic domain.…”
Section: B Contact Pressure and On-state Resistancementioning
confidence: 99%
“…Corresponding FE implementations are described in [120] and [123]. Numerical examples for electro-static interactions are given in [254] and [123].…”
Section: Electro-static Interactionsmentioning
confidence: 99%