2019
DOI: 10.1039/c8tc05932b
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A flexible memory with low-voltage and high-operation speed using an Al2O3/poly(α-methylstyrene) gate stack on a muscovite substrate

Abstract: A clear technical demonstration of the critical role of the blocking layers, which has never been addressed sufficiently in previous work.

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Cited by 16 publications
(7 citation statements)
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“…The time dependence of the on/off I DS current states of 5% PCBM memory was tested after the programming/erasing operations: −60 V for 1 s and light exposure for 5 s (532 nm and intensity of 3 mW cm –2 ). Figure c shows the slightly attenuated current states at V GS = −20 V and V DS = −10 V and time of more than 10 000 s, suggesting that the trapped hole charges can be retained in the charge-storage layers for a long time. , For the R-10 memory device, the current states after programming operations with different gate voltages were tested. To distinguish each current state, a read gate voltage of −30 V was required (Figure S4).…”
Section: Resultsmentioning
confidence: 99%
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“…The time dependence of the on/off I DS current states of 5% PCBM memory was tested after the programming/erasing operations: −60 V for 1 s and light exposure for 5 s (532 nm and intensity of 3 mW cm –2 ). Figure c shows the slightly attenuated current states at V GS = −20 V and V DS = −10 V and time of more than 10 000 s, suggesting that the trapped hole charges can be retained in the charge-storage layers for a long time. , For the R-10 memory device, the current states after programming operations with different gate voltages were tested. To distinguish each current state, a read gate voltage of −30 V was required (Figure S4).…”
Section: Resultsmentioning
confidence: 99%
“…Figure 5c shows the slightly attenuated current states at V GS = −20 V and V DS = −10 V and time of more than 10 000 s, suggesting that the trapped hole charges can be retained in the charge-storage layers for a long time. 27,38 For the R-10 memory device, the current states after programming operations with different gate voltages were tested. To distinguish each current state, a read gate voltage of −30 V was required (Figure S4).…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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“…[ 4 ] Flexible memories can be fabricated with intrinsically stretchable organic materials. [ 5 ] Many organic photochromic molecules including spiropyrans and diarylethenes have been considered for optical memory applications. [ 6 ] However, few of them meet the stringent thermo‐ and photostable requirements.…”
Section: Figurementioning
confidence: 99%
“…[17] Charge storage dielectrics have attracted considerable attention in synaptic transistors, due to the rich material sources, simple procedure, and wide process window. [18] However, the accumulated charges (holes/electrons) tend to be dissipated quickly after low-voltage operations, and reach a saturation state with improved voltages, which lead to the nonlinear behavior of the conductance switching. [11,19] The demanded nonvolatile and reliable multi-level date storage Synaptic transistors have shown great potential in neuromorphic computing, but remain challenging to simulate linear weight updates through conductance switching under low voltage spiking operation.…”
mentioning
confidence: 99%