A framework for detecting unknown defect patterns on wafer bin maps using active learning

Shin, Jin-Su; Kim, Min-Joo; Lee, Dong-Hee

doi:10.1016/j.eswa.2024.125378

Expert Systems with Applications

2025

DOI: 10.1016/j.eswa.2024.125378

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A framework for detecting unknown defect patterns on wafer bin maps using active learning

Jin-Su Shin,

Min-Joo Kim,

Dong-Hee Lee

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A framework for detecting unknown defect patterns on wafer bin maps using active learning

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References 34 publications

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