2009 Asia and South Pacific Design Automation Conference 2009
DOI: 10.1109/aspdac.2009.4796522
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A framework for estimating NBTI degradation of microarchitectural components

Abstract: Abstract-Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies … Show more

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Cited by 8 publications
(4 citation statements)
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“…Here, the signals of eavesdroppers are indirectly manipulated. [7]. In addition, in order to exhibits practical, it focused in high impact result DIWINE which is concentrate on two application such as:…”
Section: Literature Surveymentioning
confidence: 99%
“…Here, the signals of eavesdroppers are indirectly manipulated. [7]. In addition, in order to exhibits practical, it focused in high impact result DIWINE which is concentrate on two application such as:…”
Section: Literature Surveymentioning
confidence: 99%
“…These constants are obtained through an HSPICE circuit simulation. The NBTI predictive models have been widely used to analyze the influence of the NBTI effect on the circuit at the gate and architectural levels [1].…”
Section: B Nbti Modelingmentioning
confidence: 99%
“…The constants in the above equation are obtained through HSPICE circuit simulation. These NBTI predictive models have been widely used to analyze the influence of NBTI on the circuit at the gate and at the architectural level [2,[11][12][13].…”
Section: Amentioning
confidence: 99%