Proceedings of the ACM SIGPLAN 2001 Conference on Programming Language Design and Implementation 2001
DOI: 10.1145/378795.378832
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A framework for reducing the cost of instrumented code

Abstract: Instrumenting code to collect profiling information can canse substantial execution overhead. This overhead makes instrumentation difficult to perform at runt/me, often preventing many known o]fiine feedback-directed optimizations from being used in online systems. This paper presents a general framework for performing instrumentation sampling to reduce the overhead of previously expensive instrumentation. The framework is simple and effective, using codeduplication and counter-based sampling to allow switchin… Show more

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Cited by 257 publications
(158 citation statements)
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References 41 publications
(50 reference statements)
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“…We use an overlap percentage metric as in references [2,26] to compare the profiles collected on the two platforms. Informally, the overlap is the amount of profiled information (weighted by execution frequency) that is present in both profiles.…”
Section: Reproducibility Of Profilesmentioning
confidence: 99%
“…We use an overlap percentage metric as in references [2,26] to compare the profiles collected on the two platforms. Informally, the overlap is the amount of profiled information (weighted by execution frequency) that is present in both profiles.…”
Section: Reproducibility Of Profilesmentioning
confidence: 99%
“…Once the skipping process is part of the JVM, its overhead could be lowered. For a discussion of possible optimizations when incorporating profiling into a JVM, see [2]. Once the OSP algorithm is fully integrated into a JVM, its output could be used to locate possible candidates for JIT compilation.…”
Section: Discussionmentioning
confidence: 99%
“…In [2], Arnold and Ryder proposed to maintain two versions of the program in memory -one instrumented, and one almost uninstrumented. The program execution can then jump between these two versions, collecting enough data for effective profiling, but keeping the overhead low.…”
Section: Related Workmentioning
confidence: 99%
“…Note that our implementation has not been aggressively optimized. It has been shown [1] that combining instrumentation and sampling profiling leaded to accurate profiles (93-98% overlap with a perfect profile) with low overhead (3-6%). The profilers we presented in this paper are likely to benefit from such instrumentation sampling.…”
Section: Micro-benchmarkmentioning
confidence: 99%