A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx

Abraham, Jacob A.; Prasad, N.G.N; Chakravarthy, S.; Bagwe, A.; Parekhji, Rubin

doi:10.1109/test.2000.894233

Cited by 3 publications

(2 citation statements)

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“…Figure 1 illustrates a system built around a DSP core. The configuration is representative of the devices built in and supported by Texas Instruments (India) Ltd. [3]. This includes a hard DSP core, (with its own test interface), hard memory cores, (for a particular technology process node), firm memory wrappers, (with limited flexibility to modify them), and soft peripherals, (which are programmable).…”

Section: Test Considerations For Embedded Core Based Systemsmentioning

confidence: 99%

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Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems

Bagwe

Parekhji²

Proceedings of the Ninth Asian Test Symposium

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The use of embedded cores poses several new problems in testing systems built around them. An important one amongst them is the need to achieve high,fault coverage in an embedded context. Several impediments exist to obtaining a high ,fault coverage in such embedded systems. This paper presents a set of techniques,for enhancing the,fault coverage in and embedded DSP core based system. Its main contributions are: ( i ) It examines the various test constraints in such a system and the impediments to achieving a high ,fault coverage therein. (ii) It presents the development of ,fiinctional testing techniques to enhance the coverage of the individual components. (iii) It coniplements this effort by presenting fault analysis techniques, to ,further enhance this coverage. The techniques described in the paper have been used to inlprove the ,fault coverage of devices built around Texas Instruntents new DSP core, TMS32OC27xx. Results indicate the effectiveness (&functional testing and ,fault analysis techniques in raising the DSP core and memory wrapper logic coverage above 95%, over and above the best results obtained through ATPG.

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Section: Test Considerations For Embedded Core Based Systemsmentioning

confidence: 99%

“…While this design methodology benefits from the full performance entitlement of its constituent cores, it also complicates the problem of testing the individual cores themselves and the overall system [ 1, 2,3]. An important problem is the need to achieve high fault coverage in an embedded context.…”

Section: Introductionmentioning

confidence: 99%