1998
DOI: 10.1109/22.739296
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A frequency-varying method for simultaneous measurement of complex permittivity and permeability with an open-ended coaxial probe

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Cited by 50 publications
(12 citation statements)
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“…It is for this reason that the dual waveguide probe more accurately measures permeability than permittivity. Similar errors in permittivity measurements, for like measurement geometries, are noted by Wang et al [1998], Chen et al [2005], Stewart and Havrilla [2006], Maode et al [1999], Tantot et al [1997], Li and Chen [1995], and Courtney and Motil [1999]. Several of the researchers state the difficulty of obtaining accurate dielectric loss values (even physically realizable results) for low dielec- Figure 6.…”
Section: àJkrsupporting
confidence: 61%
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“…It is for this reason that the dual waveguide probe more accurately measures permeability than permittivity. Similar errors in permittivity measurements, for like measurement geometries, are noted by Wang et al [1998], Chen et al [2005], Stewart and Havrilla [2006], Maode et al [1999], Tantot et al [1997], Li and Chen [1995], and Courtney and Motil [1999]. Several of the researchers state the difficulty of obtaining accurate dielectric loss values (even physically realizable results) for low dielec- Figure 6.…”
Section: àJkrsupporting
confidence: 61%
“…Since these measurements are independent over all wavelengths and are observed simultaneously, no underdetermined optimization routines or additional measurements are required to extract permittivity and permeability [Baker-Jarvis et al, 1994;Chen et al, 2005;Maode et al, 1999;Stewart and Havrilla, 2006;Tantot et al, 1997;Wang et al, 1998]. The work presented in this paper also significantly extends that presented by Stewart and Havrilla [2007] by incorporating higher-order modes and probe alignment uncertainty.…”
Section: Resultsmentioning
confidence: 82%
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“…The restrictions for diminishing of sample preparation, the openness property of the probe structure and ability of handling of high power are the main reasons. Moreover, the reflection property of the probe (Γ) is sensitive to more than one variable, which allows to measure different parameters of test material such as electromagnetic parameters (ε r , µ r ) and its thickness as well [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…These techniques can be performed via changing thickness of the test material (d), or changing the measurement frequency (f), or changing part of the tested material. They are respectively called Thickness-Varying Method (TVM) [11], Frequency-Varying Method (FVM) [12] and Sample-Varying Method (SVM) [11]. Both TVM method and FVM method are performed using single-layer (test material only) while SVM method is performed using two layers of known material followed by test material.…”
Section: Introductionmentioning
confidence: 99%