A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation

Stratigopoulos,; Tongbong,; Mir,

doi:10.1109/date.2008.4484662

Cited by 8 publications

(4 citation statements)

References 16 publications

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“…The Monte Carlo (MC) method was used as the numerical reference standard for model verification. Many approaches have been explored in the literature toward estimation of performance metrics, with ppm precision, for electronic circuits [ 29 , 30 , 31 , 32 , 33 , 34 ]. Statistical model of the electronic circuit that can be simulated very fast is crucial to achieve them in reasonable time.…”

Section: Probabilistic Models Of the Measurement Processmentioning

confidence: 99%

“…Statistical model of the electronic circuit that can be simulated very fast is crucial to achieve them in reasonable time. In [ 29 ], the proposed method relies on estimating the joint probability density function (pdf), which is subsequently sampled to rapidly generate a large volume of new data. In [ 30 ] authors used a very fast statistical simulation called statistical blockade [ 31 ].…”

Section: Probabilistic Models Of the Measurement Processmentioning

confidence: 99%

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Risk Analysis by a Probabilistic Model of the Measurement Process

Toczek

Smulko

2021

Sensors

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The aim of the article is presentation of the testing methodology and results of examination the probabilistic model of the measurement process. The case study concerns the determination of the risk of an incorrect decision in the assessment of the compliance of products by measurement. Measurand is characterized by the generalized Rayleigh distribution. The model of the measurement process was tested in parallel mode by six risk metrics. An undesirable effect in the reconstruction building block of the model was detected, consisting in the distortion of probability distribution at the edges of the measuring range. The paper gives guidelines on how to use the model, to obtain the analytical risk assessment consistent with the results of the Monte Carlo method. The study can be useful in product quality control, test design, and fault diagnosis.

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Section: Probabilistic Models Of the Measurement Processmentioning

confidence: 99%

Section: Probabilistic Models Of the Measurement Processmentioning

confidence: 99%

Risk Analysis by a Probabilistic Model of the Measurement Process

Toczek

Smulko

2021

Sensors

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“…By using the Parzen–Rosenblatt window method [10], which consists of a kernel density estimator (KDE), it is possible to estimate the marginal distribution function of each random variable of interest (the five specifications and the measurement). This way, new samples can be generated respecting the probability distributions provided by the first simulation samples.…”

Section: Statistical Modelingmentioning

confidence: 99%

“…In our case, an optimized bandwidth estimator based on the Epanechnikov kernel function was employed to minimize the integrated mean square error of each estimated function (the same is proposed in [10]): …”

Section: Statistical Modelingmentioning

confidence: 99%

A new methodology for optimal RF DFT sensor design

Mesadri

Doukkali

Descamps

et al. 2012

Int. J. Microw. Wireless Technol.

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In this paper, a new methodology to compare the robustness of sensor structures employed in radiofrequency design for test (RF DFT) architectures for RF integrated circuits (ICs) is proposed. First, the yield loss and defect level of the test technique is evaluated using a statistical model of the Circuit under Test (obtained through non-parametric statistics and copula theory). Then, by carrying out the dispersion analysis of the sensor architecture, a figure of merit is established. This methodology reduces the number of iterations in the design flow of RF DFT sensors and makes it possible to evaluate process dispersion. The case study is a SiGe:C BiCMOS LNA tested by a single-probe measurement.

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Self-testing of fully differential multistage circuits using common-mode excitation

Toczek

2008

Microelectronics Reliability

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A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation

Cited by 8 publications

References 16 publications

Risk Analysis by a Probabilistic Model of the Measurement Process

Risk Analysis by a Probabilistic Model of the Measurement Process

A new methodology for optimal RF DFT sensor design

Self-testing of fully differential multistage circuits using common-mode excitation

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