2019
DOI: 10.1063/1.5091965
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A generic method for equipping arbitrary rf discharge simulation frameworks with external lumped element circuits

Abstract: External electric circuits attached to radio-frequency plasma discharges are essential for the power transfer into the discharge and are, therefore, a key element for plasma operation. Many plasma simulations, however, simplify or even neglect the external network. This is because a solution of the circuit's auxiliary differential equations following Kirchhoff's laws is required, which can become a tedious task especially for large circuits. This work proposes a method, which allows to include electric circuit… Show more

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Cited by 9 publications
(3 citation statements)
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“…Recently, a generalized method to simulate CCP and external matching networks together is proposed by Schmidt [76,104]. The voltage across the electrode usually changes significantly, so the simulation of the breakdown process must be coupled to an external circuit model, as has been demonstrated by previous results of others and our preliminary results.…”
Section: Future Trends Of Previous Mrf Breakdown Modelsmentioning
confidence: 71%
See 1 more Smart Citation
“…Recently, a generalized method to simulate CCP and external matching networks together is proposed by Schmidt [76,104]. The voltage across the electrode usually changes significantly, so the simulation of the breakdown process must be coupled to an external circuit model, as has been demonstrated by previous results of others and our preliminary results.…”
Section: Future Trends Of Previous Mrf Breakdown Modelsmentioning
confidence: 71%
“…Many works have shown that the external circuit plays an important role in protecting the power cabinet and adjusting the power matching. In previous theoretical studies, by simplifying the external circuit [16,[71][72][73], the plasma properties can be studied, but the effect of the plasma on the complex matching circuit cannot be studied; by simplifying the plasma as a network of capacitors, resistors and inductors [74][75][76][77], the characteristics of power matching under complex matching circuits can be studied, but the effects of matching circuits on plasma cannot be studied self-consistently.…”
Section: Theoretical and Numerical Research Into Mrf Breakdownmentioning
confidence: 99%
“…In this case one can proceed similar to the ES case [55]. However, we decided to reserve the effects associated with complex external networks [79][80][81] for a separate study and consider here only a simple external network with a single blocking capacitor of capacitance C. In this case of an unmatched reactor load, the total plasma impedance is dominated by the capacitive sheaths. It causes only a relatively small fraction of the incoming power to be absorbed by the plasma bulk, and a large fraction of the power produced by the generator to be reflected back.…”
Section: Em Pic Modelmentioning
confidence: 99%